A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images
In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes topical subject in industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in practice, where deep learning-based algorithms perform better than t...
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| Vydané v: | IEEE access Ročník 11; s. 1 |
|---|---|
| Hlavní autori: | , , |
| Médium: | Journal Article |
| Jazyk: | English |
| Vydavateľské údaje: |
Piscataway
IEEE
01.01.2023
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Predmet: | |
| ISSN: | 2169-3536, 2169-3536 |
| On-line prístup: | Získať plný text |
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