Yuan, L., Zhou, S., Pan, P., & Wang, Z. (2022). MLD: An Intelligent Memory Leak Detection Scheme Based on Defect Modes in Software. Entropy (Basel, Switzerland), 24(7), 947. https://doi.org/10.3390/e24070947
Citace podle Chicago (17th ed.)Yuan, Ling, Siyuan Zhou, Peng Pan, a Zhenjiang Wang. "MLD: An Intelligent Memory Leak Detection Scheme Based on Defect Modes in Software." Entropy (Basel, Switzerland) 24, no. 7 (2022): 947. https://doi.org/10.3390/e24070947.
Citace podle MLA (9th ed.)Yuan, Ling, et al. "MLD: An Intelligent Memory Leak Detection Scheme Based on Defect Modes in Software." Entropy (Basel, Switzerland), vol. 24, no. 7, 2022, p. 947, https://doi.org/10.3390/e24070947.
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