FixMiner: Mining relevant fix patterns for automated program repair

Patching is a common activity in software development. It is generally performed on a source code base to address bugs or add new functionalities. In this context, given the recurrence of bugs across projects, the associated similar patches can be leveraged to extract generic fix actions. While the...

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Published in:	Empirical software engineering : an international journal Vol. 25; no. 3; pp. 1980 - 2024
Main Authors:	Koyuncu, Anil, Liu, Kui, Bissyandé, Tegawendé F., Kim, Dongsun, Klein, Jacques, Monperrus, Martin, Le Traon, Yves
Format:	Journal Article
Language:	English
Published:	New York Springer US 01.05.2020 Springer Nature B.V
Subjects:	Automation Clustering Compilers Computer Science Context Debugging Empirical software engineering Fix patterns Interpreters Patches Patching Program repair Programming Languages Repair Scripts Software development Software Engineering/Programming and Operating Systems Source code Trees Fix patterns Program repair Empirical software engineering Debugging Patches
ISSN:	1382-3256, 1573-7616, 1573-7616
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Abstract	Patching is a common activity in software development. It is generally performed on a source code base to address bugs or add new functionalities. In this context, given the recurrence of bugs across projects, the associated similar patches can be leveraged to extract generic fix actions. While the literature includes various approaches leveraging similarity among patches to guide program repair, these approaches often do not yield fix patterns that are tractable and reusable as actionable input to APR systems. In this paper, we propose a systematic and automated approach to mining relevant and actionable fix patterns based on an iterative clustering strategy applied to atomic changes within patches. The goal of FixMiner is thus to infer separate and reusable fix patterns that can be leveraged in other patch generation systems. Our technique, FixMiner, leverages Rich Edit Script which is a specialized tree structure of the edit scripts that captures the AST-level context of the code changes. FixMiner uses different tree representations of Rich Edit Scripts for each round of clustering to identify similar changes. These are abstract syntax trees, edit actions trees, and code context trees. We have evaluated FixMiner on thousands of software patches collected from open source projects. Preliminary results show that we are able to mine accurate patterns, efficiently exploiting change information in Rich Edit Scripts. We further integrated the mined patterns to an automated program repair prototype, PAR FixMiner , with which we are able to correctly fix 26 bugs of the Defects4J benchmark. Beyond this quantitative performance, we show that the mined fix patterns are sufficiently relevant to produce patches with a high probability of correctness: 81% of PAR FixMiner ’s generated plausible patches are correct.
AbstractList	Patching is a common activity in software development. It is generally performed on a source code base to address bugs or add new functionalities. In this context, given the recurrence of bugs across projects, the associated similar patches can be leveraged to extract generic fix actions. While the literature includes various approaches leveraging similarity among patches to guide program repair, these approaches often do not yield fix patterns that are tractable and reusable as actionable input to APR systems. In this paper, we propose a systematic and automated approach to mining relevant and actionable fix patterns based on an iterative clustering strategy applied to atomic changes within patches. The goal of FixMiner is thus to infer separate and reusable fix patterns that can be leveraged in other patch generation systems. Our technique, FixMiner, leverages Rich Edit Script which is a specialized tree structure of the edit scripts that captures the AST-level context of the code changes. FixMiner uses different tree representations of Rich Edit Scripts for each round of clustering to identify similar changes. These are abstract syntax trees, edit actions trees, and code context trees. We have evaluated FixMiner on thousands of software patches collected from open source projects. Preliminary results show that we are able to mine accurate patterns, efficiently exploiting change information in Rich Edit Scripts. We further integrated the mined patterns to an automated program repair prototype, PAR(FixMiner), with which we are able to correctly fix 26 bugs of the Defects4J benchmark. Beyond this quantitative performance, we show that the mined fix patterns are sufficiently relevant to produce patches with a high probability of correctness: 81% of PAR(FixMiner)'s generated plausible patches are correct. Patching is a common activity in software development. It is generally performed on a source code base to address bugs or add new functionalities. In this context, given the recurrence of bugs across projects, the associated similar patches can be leveraged to extract generic fix actions. While the literature includes various approaches leveraging similarity among patches to guide program repair, these approaches often do not yield fix patterns that are tractable and reusable as actionable input to APR systems. In this paper, we propose a systematic and automated approach to mining relevant and actionable fix patterns based on an iterative clustering strategy applied to atomic changes within patches. The goal of FixMiner is thus to infer separate and reusable fix patterns that can be leveraged in other patch generation systems. Our technique, FixMiner, leverages Rich Edit Script which is a specialized tree structure of the edit scripts that captures the AST-level context of the code changes. FixMiner uses different tree representations of Rich Edit Scripts for each round of clustering to identify similar changes. These are abstract syntax trees, edit actions trees, and code context trees. We have evaluated FixMiner on thousands of software patches collected from open source projects. Preliminary results show that we are able to mine accurate patterns, efficiently exploiting change information in Rich Edit Scripts. We further integrated the mined patterns to an automated program repair prototype, PARFixMiner, with which we are able to correctly fix 26 bugs of the Defects4J benchmark. Beyond this quantitative performance, we show that the mined fix patterns are sufficiently relevant to produce patches with a high probability of correctness: 81% of PARFixMiner’s generated plausible patches are correct. Patching is a common activity in software development. It is generally performed on a source code base to address bugs or add new functionalities. In this context, given the recurrence of bugs across projects, the associated similar patches can be leveraged to extract generic fix actions. While the literature includes various approaches leveraging similarity among patches to guide program repair, these approaches often do not yield fix patterns that are tractable and reusable as actionable input to APR systems. In this paper, we propose a systematic and automated approach to mining relevant and actionable fix patterns based on an iterative clustering strategy applied to atomic changes within patches. The goal of FixMiner is thus to infer separate and reusable fix patterns that can be leveraged in other patch generation systems. Our technique, FixMiner, leverages Rich Edit Script which is a specialized tree structure of the edit scripts that captures the AST-level context of the code changes. FixMiner uses different tree representations of Rich Edit Scripts for each round of clustering to identify similar changes. These are abstract syntax trees, edit actions trees, and code context trees. We have evaluated FixMiner on thousands of software patches collected from open source projects. Preliminary results show that we are able to mine accurate patterns, efficiently exploiting change information in Rich Edit Scripts. We further integrated the mined patterns to an automated program repair prototype, PAR FixMiner , with which we are able to correctly fix 26 bugs of the Defects4J benchmark. Beyond this quantitative performance, we show that the mined fix patterns are sufficiently relevant to produce patches with a high probability of correctness: 81% of PAR FixMiner ’s generated plausible patches are correct.
Author	Kim, Dongsun Klein, Jacques Le Traon, Yves Monperrus, Martin Liu, Kui Koyuncu, Anil Bissyandé, Tegawendé F.
Author_xml	– sequence: 1 givenname: Anil surname: Koyuncu fullname: Koyuncu, Anil email: anil.koyuncu@uni.lu organization: SnT, University of Luxembourg – sequence: 2 givenname: Kui surname: Liu fullname: Liu, Kui organization: SnT, University of Luxembourg – sequence: 3 givenname: Tegawendé F. orcidid: 0000-0001-7270-9869 surname: Bissyandé fullname: Bissyandé, Tegawendé F. organization: SnT, University of Luxembourg – sequence: 4 givenname: Dongsun surname: Kim fullname: Kim, Dongsun organization: Furiosa.ai – sequence: 5 givenname: Jacques surname: Klein fullname: Klein, Jacques organization: SnT, University of Luxembourg – sequence: 6 givenname: Martin surname: Monperrus fullname: Monperrus, Martin organization: KTH Royal Institute of Technology – sequence: 7 givenname: Yves surname: Le Traon fullname: Le Traon, Yves organization: SnT, University of Luxembourg
BackLink	https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-273899$$DView record from Swedish Publication Index (Kungliga Tekniska Högskolan)
BookMark	eNp9kE9PGzEQxa0qSOVPv0BPK3F2O2Ov115uUWhapFS90F4tb9YbDIm92E4b8ulxCQKJA6eZw--9efNOyMQHbwn5jPAFAeTXhNA0NQVsKbRSAd1_IMcoJKeywWZSdq4Y5Uw0H8lJSrcABavFMZnN3e6n8zZeVGU4v6qiXdu_xudqcLtqNDnb6FM1hFiZbQ4bk21fjTGsotkUdjQunpGjwayT_fQ8T8nv-bfr2Q-6-PX9ajZd0GUNmKliCpXgYARrl7zjHJnlXLRWtqxG1TNhleEDlwK6VvK-EbaXXY_IUYgOBn5K6ME3_bPjttNjdBsTH3QwTl-6P1Md4krf5RvNJFdtW_jzA1_i3m9tyvo2bKMvETWrAVAgCigUO1DLGFKKdnjxRdD_y9WHcnUpVz-Vq_dFpN6Ili6b7ILP0bj1-1L-_EW541c2vqZ6R_UI9SaP7A
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ContentType	Journal Article
Copyright	Springer Science+Business Media, LLC, part of Springer Nature 2020 Springer Science+Business Media, LLC, part of Springer Nature 2020.
Copyright_xml	– notice: Springer Science+Business Media, LLC, part of Springer Nature 2020 – notice: Springer Science+Business Media, LLC, part of Springer Nature 2020.
DBID	AAYXX CITATION 7SC 8FD 8FE 8FG ABJCF AFKRA ARAPS BENPR BGLVJ CCPQU DWQXO HCIFZ JQ2 L6V L7M L~C L~D M7S P5Z P62 PHGZM PHGZT PKEHL PQEST PQGLB PQQKQ PQUKI PTHSS S0W ADTPV AOWAS D8V
DOI	10.1007/s10664-019-09780-z
DatabaseName	CrossRef Computer and Information Systems Abstracts Technology Research Database ProQuest SciTech Collection ProQuest Technology Collection Materials Science & Engineering Collection ProQuest Central UK/Ireland Advanced Technologies & Computer Science Collection ProQuest Central (subscription) Technology collection ProQuest One Community College ProQuest Central SciTech Premium Collection ProQuest Computer Science Collection ProQuest Engineering Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional Engineering Database Advanced Technologies & Aerospace Database ProQuest Advanced Technologies & Aerospace Collection ProQuest Central Premium ProQuest One Academic ProQuest One Academic Middle East (New) ProQuest One Academic Eastern Edition (DO NOT USE) One Applied & Life Sciences ProQuest One Academic (retired) ProQuest One Academic UKI Edition Engineering Collection DELNET Engineering & Technology Collection SwePub SwePub Articles SWEPUB Kungliga Tekniska Högskolan
DatabaseTitle	CrossRef Technology Collection Technology Research Database Computer and Information Systems Abstracts – Academic ProQuest One Academic Middle East (New) ProQuest Advanced Technologies & Aerospace Collection ProQuest Computer Science Collection Computer and Information Systems Abstracts SciTech Premium Collection ProQuest One Community College ProQuest Central ProQuest One Applied & Life Sciences ProQuest Engineering Collection ProQuest Central Korea ProQuest Central (New) Advanced Technologies Database with Aerospace Engineering Collection Advanced Technologies & Aerospace Collection Engineering Database ProQuest One Academic Eastern Edition ProQuest Technology Collection ProQuest SciTech Collection Computer and Information Systems Abstracts Professional Advanced Technologies & Aerospace Database ProQuest One Academic UKI Edition ProQuest DELNET Engineering and Technology Collection Materials Science & Engineering Collection ProQuest One Academic ProQuest One Academic (New)
DatabaseTitleList	Technology Collection
Database_xml	– sequence: 1 dbid: BENPR name: ProQuest Central url: https://www.proquest.com/central sourceTypes: Aggregation Database
DeliveryMethod	fulltext_linktorsrc
Discipline	Computer Science
EISSN	1573-7616
EndPage	2024
ExternalDocumentID	oai_DiVA_org_kth_273899 10_1007_s10664_019_09780_z
GrantInformation_xml	– fundername: Fonds National de la Recherche Luxembourg grantid: RECOMMEND C15/IS/10449467; FIXPATTERN C15/IS/9964569 funderid: https://doi.org/10.13039/501100001866
GroupedDBID	-4Z -59 -5G -BR -EM -Y2 -~C .86 .DC .VR 06D 0R~ 0VY 199 1N0 1SB 2.D 203 28- 29G 2J2 2JN 2JY 2KG 2LR 2P1 2VQ 2~H 30V 4.4 406 408 409 40D 40E 5GY 5QI 5VS 67Z 6NX 78A 8FE 8FG 8TC 8UJ 95- 95. 95~ 96X AABHQ AACDK AAHNG AAIAL AAJBT AAJKR AANZL AAOBN AARHV AARTL AASML AATNV AATVU AAUYE AAWCG AAYIU AAYOK AAYQN AAYTO AAYZH ABAKF ABBBX ABBXA ABDZT ABECU ABFTD ABFTV ABHLI ABHQN ABJCF ABJNI ABJOX ABKCH ABKTR ABMNI ABMQK ABNWP ABQBU ABQSL ABSXP ABTEG ABTHY ABTKH ABTMW ABULA ABWNU ABXPI ACAOD ACBXY ACDTI ACGFS ACHSB ACHXU ACIWK ACKNC ACMDZ ACMLO ACOKC ACOMO ACPIV ACSNA ACZOJ ADHHG ADHIR ADIMF ADINQ ADKNI ADKPE ADRFC ADTPH ADURQ ADYFF ADZKW AEBTG AEFIE AEFQL AEGAL AEGNC AEJHL AEJRE AEKMD AEMSY AENEX AEOHA AEPYU AESKC AETLH AEVLU AEXYK AFBBN AFEXP AFGCZ AFKRA AFLOW AFQWF AFWTZ AFZKB AGAYW AGDGC AGGDS AGJBK AGMZJ AGQEE AGQMX AGRTI AGWIL AGWZB AGYKE AHAVH AHBYD AHKAY AHSBF AHYZX AIAKS AIGIU AIIXL AILAN AITGF AJBLW AJRNO AJZVZ ALMA_UNASSIGNED_HOLDINGS ALWAN AMKLP AMXSW AMYLF AMYQR AOCGG ARAPS ARMRJ ASPBG AVWKF AXYYD AYJHY AZFZN B-. BA0 BBWZM BDATZ BENPR BGLVJ BGNMA BSONS CAG CCPQU COF CS3 CSCUP DDRTE DL5 DNIVK DPUIP DU5 EBLON EBS EIOEI EJD ESBYG FEDTE FERAY FFXSO FIGPU FINBP FNLPD FRRFC FSGXE FWDCC GGCAI GGRSB GJIRD GNWQR GQ6 GQ7 GQ8 GXS H13 HCIFZ HF~ HG5 HG6 HMJXF HQYDN HRMNR HVGLF HZ~ I09 IHE IJ- IKXTQ ITM IWAJR IXC IZIGR IZQ I~X I~Z J-C J0Z JBSCW JCJTX JZLTJ KDC KOV KOW L6V LAK LLZTM M4Y M7S MA- N2Q NB0 NDZJH NPVJJ NQJWS NU0 O9- O93 O9G O9I O9J OAM P19 P62 P9O PF0 PT4 PT5 PTHSS Q2X QOK QOS R4E R89 R9I RHV RNI RNS ROL RPX RSV RZC RZE RZK S0W S16 S1Z S26 S27 S28 S3B SAP SCJ SCLPG SCO SDH SDM SHX SISQX SJYHP SNE SNPRN SNX SOHCF SOJ SPISZ SRMVM SSLCW STPWE SZN T13 T16 TSG TSK TSV TUC U2A UG4 UOJIU UTJUX UZXMN VC2 VFIZW W23 W48 WK8 YLTOR Z45 Z7R Z7S Z7V Z7X Z7Z Z81 Z83 Z86 Z88 Z8M Z8N Z8P Z8R Z8T Z8U Z8W Z92 ZMTXR ~EX AAPKM AAYXX ABBRH ABDBE ABFSG ABRTQ ACSTC ADHKG AEZWR AFDZB AFFHD AFHIU AFOHR AGQPQ AHPBZ AHWEU AIXLP ATHPR AYFIA CITATION PHGZM PHGZT PQGLB 7SC 8FD DWQXO JQ2 L7M L~C L~D PKEHL PQEST PQQKQ PQUKI ADTPV AOWAS D8V
ID	FETCH-LOGICAL-c401t-82818530a529c3b3312e3359e792418d25e8a3f3750b973d65ed7bd113155b0f3
IEDL.DBID	RSV
ISICitedReferencesCount	140
ISICitedReferencesURI	http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000531720100008&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN	1382-3256 1573-7616
IngestDate	Tue Nov 04 16:40:47 EST 2025 Tue Dec 02 15:59:10 EST 2025 Tue Nov 18 21:13:40 EST 2025 Sat Nov 29 05:37:44 EST 2025 Fri Feb 21 02:35:49 EST 2025
IsDoiOpenAccess	false
IsOpenAccess	true
IsPeerReviewed	true
IsScholarly	true
Issue	3
Keywords	Fix patterns Program repair Empirical software engineering Debugging Patches
Language	English
LinkModel	DirectLink
MergedId	FETCHMERGED-LOGICAL-c401t-82818530a529c3b3312e3359e792418d25e8a3f3750b973d65ed7bd113155b0f3
Notes	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14
ORCID	0000-0001-7270-9869
OpenAccessLink	http://orbilu.uni.lu/handle/10993/44172
PQID	2400151150
PQPubID	326341
PageCount	45
ParticipantIDs	swepub_primary_oai_DiVA_org_kth_273899 proquest_journals_2400151150 crossref_primary_10_1007_s10664_019_09780_z crossref_citationtrail_10_1007_s10664_019_09780_z springer_journals_10_1007_s10664_019_09780_z
PublicationCentury	2000
PublicationDate	2020-05-01
PublicationDateYYYYMMDD	2020-05-01
PublicationDate_xml	– month: 05 year: 2020 text: 2020-05-01 day: 01
PublicationDecade	2020
PublicationPlace	New York
PublicationPlace_xml	– name: New York – name: Dordrecht
PublicationSubtitle	An International Journal
PublicationTitle	Empirical software engineering : an international journal
PublicationTitleAbbrev	Empir Software Eng
PublicationYear	2020
Publisher	Springer US Springer Nature B.V
Publisher_xml	– name: Springer US – name: Springer Nature B.V
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SSID	ssj0009745
Score	2.6212013
Snippet	Patching is a common activity in software development. It is generally performed on a source code base to address bugs or add new functionalities. In this...
SourceID	swepub proquest crossref springer
SourceType	Open Access Repository Aggregation Database Enrichment Source Index Database Publisher
StartPage	1980
SubjectTerms	Automation Clustering Compilers Computer Science Context Debugging Empirical software engineering Fix patterns Interpreters Patches Patching Program repair Programming Languages Repair Scripts Software development Software Engineering/Programming and Operating Systems Source code Trees
SummonAdditionalLinks	– databaseName: Engineering Database dbid: M7S link: http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV09T8MwELWgMLBQPkWhIA-IBSKSOG1iFoSAioUKiQ91s-zYgQjUljZFqL-eO9dpBEMXstqOo5zte7bv3iPkOJOaS4AdXhrBFiUyJvEUD7WnAg2PjLDUik3E3W7S6_EHd-A2dmGV5ZpoF2o9SPGM_BxjHcE7AX65HH56qBqFt6tOQmOZrCBLQmhD9x4r0t3YihQjzZ7HwLe7pBmXOtduY_wFBgzFie9NfzumCm3OL0j_kIlaB9Sp__fTN8i6g570ajZWNsmS6W-ReinrQN0s3ybXnfz7HnMCL-i9lY-gKKwCiLugWf5Nh5aRsz-mAHepnBQDwLxGUxfoBXWHMh_tkOfO7dP1nee0FsBIflBgNjl6bl-2Qp4yxVgQGsZa3MSwQQsSHbZMIlnGAGAoHjPdbhkdKx0EDACJ8jO2S2r9Qd_sEZrBDk8nKjNZBk0jpnwT-oDCZDvVUkW8QYLyR4vUEZGjHsaHqCiU0TgCjCOsccS0QU7nbYYzGo6FtZulIYSbkmNRWaFBzkqbVsWL3nYys_u8Z6TkvslfrsRg9CreizeB-U2c7y_u9oCshbhZt9GSTVIrRhNzSFbTryIfj47syP0B9cHzSA priority: 102 providerName: ProQuest
Title	FixMiner: Mining relevant fix patterns for automated program repair
URI	https://link.springer.com/article/10.1007/s10664-019-09780-z https://www.proquest.com/docview/2400151150 https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-273899
Volume	25
WOSCitedRecordID	wos000531720100008&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText	1
inHoldings	1
isFullTextHit
isPrint
journalDatabaseRights	– providerCode: PRVAVX databaseName: SpringerLINK Contemporary 1997-Present customDbUrl: eissn: 1573-7616 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0009745 issn: 1573-7616 databaseCode: RSV dateStart: 19970101 isFulltext: true titleUrlDefault: https://link.springer.com/search?facet-content-type=%22Journal%22 providerName: Springer Nature
link	http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV07T8MwED7xGlgoT1EelQfEApGSOGliNl4VS6uqQIVYLDt2IAK1VRsQ6q_n7CYtIFQJMmTxI9adnftOvvsO4CgVigmEHU4SoIsSaB07kvnKkZ7CRwSm1RabiFqt-OGBtYuksFEZ7V5eSdo_9Zdkt3rdREyYEJ8odp3xIiyjuYvNcezcdmdUu5EtTWzI9RyKFr1Ilfl9ju_maIYxp9eiPyhErdlpVP634HVYK2AmOZ_siw1Y0L1NqJQlHEhxorfgspF9NE3-3xlp2lIRxBRRQXSdkzT7IAPLvtkbEYS2RLzlfcS3WpEiqAv7DkQ23Ib7xvXd5Y1T1FVAhbhebjLHjZV2ReizhEpKPV9TGjIdoTPmxcoPdSxoShFMSBZRVQ-1iqTyPIrgQ7op3YGlXr-nd4Gk6M2pWKY6TXFoQKWrfRcRl6gnSsiAVcErxcuTgnTc1L545TO6ZCMljlLiVkp8XIWT6ZjBhHJjbu-DUmu8OH4jbgJjEcog2K3CaamcWfO82Y4n2p5-2dBvX2Xdc94fPvGX_JmbXCbG9v427z6s-sZRt5GSB7CUD9_0Iawk73k2GtZg-eK61e7UTODpLb7b4WPN7ulPv3zuCA
linkProvider	Springer Nature
linkToHtml	http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMw1V1LT9tAEB7RtFK5QF-I8Ch7aHtprdpeJ_YiIYSgEQgSVSqtuG13vWuwQElIzPNH8RuZ2dixyiE3DvV1X7Zndh67M_MBfMqUEQrNDi-N0EWJrE08LULj6cDgoyJqdWATca-XnJyIn3PwUOXCUFhlJROdoDaDlM7Iv1OsI2ontF-2h5ceoUbR7WoFoTFhi0N7d4Mu23jrYA_p-zkMOz-Od_e9ElUAX8cPCsqbJh3lq1YoUq45D0LLeUvYGF2RIDFhyyaKZxxVqRYxN-2WNbE2QcBR9Wo_4zjvC3gZkfR3oYK_6iK_sQNFprJ-HkdbokzSKVP12m2K96AApTjxvft_FWFt3U4vZJ8UL3UKr7P4v_2qN7BQmtZsZ7IX3sKc7b-DxQq2gpVS7D3sdvLbLuU8brKug8dgBByDHkXBsvyWDV3F0f6YoTnP1FUxQJveGlYGsmHfocpHH-D3s3zKEjT6g75dBpahB2sSndksw6ER174NfbQyVTs1SkeiCUFFWJmWhdYJ7-NC1iWiiRkkMoN0zCDvm_B1OmY4KTMys_daRXhZipyxrKnehG8VD9XNs2b7MuGz6cpUcnwv_7MjB6NTeV6cScrfEmJl9rIb8Hr_uHskjw56h6swH9LBhIsMXYNGMbqy6_AqvS7y8eij2zUM_j437z0CmtpL7A
linkToPdf	http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMw1V1Lb9QwEB6VghAXylMsFPABuEDUJE42MRJCVZcVVelqD4AqLq4d2zQq2l12Uyj9afw6ZrzORnDYWw_k6lcSf_bM2DPzATxzygiFakdUZWiiZNaWkRapiXRi8FEZlXqyiWI0Ko-OxHgDfrexMORW2e6JfqM204rOyHfI1xGlE-ovOy64RYwHw7ez7xExSNFNa0unsYTIgf31E823xZv9Ac718zQdvvu49z4KDAP4anHSUAw1yatY5amouOY8SS3nubAFmiVJadLcloo7jmJVi4Kbfm5NoU2ScBTDOnYc-70CVwu0McnwG-dfuoS_hSdIphR_EUe9IgTshLC9fp98P8hZqSjj6OJvodhpuqvL2X8SmXrhN9z6n3_bLbgZVG62u1wjt2HDTu7AVktnwcLudhf2hvX5IcVCvmaHnjaDEaEMWhoNc_U5m_lMpJMFQzWfqbNmirq-NSw4uGHdmarn9-DTpXzKfdicTCf2ATCHlq0ptbPOYdOM69imMWqfql8ZpTPRg6SdZFmFBOzEA_JNdqmjCRgSgSE9MORFD16u2syW6UfW1t5uQSDDVrSQHQJ68KrFU1e8rrcXS8ytRqZU5IP6866czr_K0-ZEUlyXEA_XD_sUriPk5If90cEjuJHSeYV3GN2GzWZ-Zh_DtepHUy_mT_wCYnB82dD7Axz9VM8
openUrl	ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=FixMiner%3A+Mining+relevant+fix+patterns+for+automated+program+repair&rft.jtitle=Empirical+software+engineering+%3A+an+international+journal&rft.au=Koyuncu%2C+Anil&rft.au=Liu%2C+Kui&rft.au=Bissyand%C3%A9%2C+Tegawend%C3%A9+F.&rft.au=Kim%2C+Dongsun&rft.date=2020-05-01&rft.pub=Springer+US&rft.issn=1382-3256&rft.eissn=1573-7616&rft.volume=25&rft.issue=3&rft.spage=1980&rft.epage=2024&rft_id=info:doi/10.1007%2Fs10664-019-09780-z&rft.externalDocID=10_1007_s10664_019_09780_z
thumbnail_l	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1382-3256&client=summon
thumbnail_m	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1382-3256&client=summon
thumbnail_s	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1382-3256&client=summon