Hard X-ray nanoprobe at beamline P06 at PETRA III

We describe the hard X-ray scanning microscope planned for the new synchrotron radiation source PETRA III at DESY in Hamburg, Germany. It is based on nanofocusing refractive X-ray lenses and is designed for two-dimensional mapping and scanning tomography. It supports X-ray fluorescence and (coherent...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 616; no. 2; pp. 93 - 97
Main Authors: Schroer, Christian G., Boye, Pit, Feldkamp, Jan M., Patommel, Jens, Samberg, Dirk, Schropp, Andreas, Schwab, Andreas, Stephan, Sandra, Falkenberg, Gerald, Wellenreuther, Gerd, Reimers, Nadja
Format: Journal Article
Language:English
Published: Elsevier B.V 01.05.2010
Subjects:
Detectors
Focusing
Hard X-ray nanoprobe
Hard X-ray scanning microscope
Nanocomposites
Nanofocusing lenses
Nanomaterials
Nanostructure
Refractive X-ray lenses
Scanning
Spatial resolution
X-rays
Refractive X-ray lenses
Nanofocusing lenses
Hard X-ray nanoprobe
Hard X-ray scanning microscope
ISSN:0168-9002, 1872-9576
Online Access:Get full text
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Summary:We describe the hard X-ray scanning microscope planned for the new synchrotron radiation source PETRA III at DESY in Hamburg, Germany. It is based on nanofocusing refractive X-ray lenses and is designed for two-dimensional mapping and scanning tomography. It supports X-ray fluorescence and (coherent) diffraction contrast, yielding elemental and structural information from inside the sample. Spatial resolutions down to well below 50 nm are aimed for in direct space. A further increase in spatial resolution is expected by applying ptychographic scanning schemes. The optical scheme with a two-stage focusing optic is described.
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SourceType-Scholarly Journals-1
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ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2009.10.094