Intelligent Particle Filter and Its Application to Fault Detection of Nonlinear System
The particle filter (PF) provides a kind of novel technique for estimating the hidden states of the nonlinear and/or non-Gaussian systems. However, the general PF always suffers from the particle impoverishment problem, which can lead to the misleading state estimation results. To cope with this pro...
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| Vydáno v: | IEEE transactions on industrial electronics (1982) Ročník 62; číslo 6; s. 3852 - 3861 |
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| Hlavní autoři: | , |
| Médium: | Journal Article |
| Jazyk: | angličtina |
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New York
IEEE
01.06.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN: | 0278-0046, 1557-9948 |
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| Abstract | The particle filter (PF) provides a kind of novel technique for estimating the hidden states of the nonlinear and/or non-Gaussian systems. However, the general PF always suffers from the particle impoverishment problem, which can lead to the misleading state estimation results. To cope with this problem, a modified particle filter, i.e., intelligent particle filter (IPF), is proposed in this paper. It is inspired from the genetic algorithm. The particle impoverishment in general PF mainly results from the poverty of particle diversity. In IPF, the genetic-operators-based strategy is designed to further improve the particle diversity. It should be pointed out that the general PF is a special case of the proposed IPF with the specified parameters. Two experiment examples show that IPF mitigates particle impoverishment and provides more accurate state estimation results compared with the general PF. Finally, the proposed IPF is implemented for real-time fault detection on a three-tank system, and the results are satisfactory. |
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| AbstractList | The particle filter (PF) provides a kind of novel technique for estimating the hidden states of the nonlinear and/or non-Gaussian systems. However, the general PF always suffers from the particle impoverishment problem, which can lead to the misleading state estimation results. To cope with this problem, a modified particle filter, i.e., intelligent particle filter (IPF), is proposed in this paper. It is inspired from the genetic algorithm. The particle impoverishment in general PF mainly results from the poverty of particle diversity. In IPF, the genetic-operators-based strategy is designed to further improve the particle diversity. It should be pointed out that the general PF is a special case of the proposed IPF with the specified parameters. Two experiment examples show that IPF mitigates particle impoverishment and provides more accurate state estimation results compared with the general PF. Finally, the proposed IPF is implemented for real-time fault detection on a three-tank system, and the results are satisfactory. |
| Author | Shen Yin Xiangping Zhu |
| Author_xml | – sequence: 1 givenname: Shen surname: Yin fullname: Yin, Shen – sequence: 2 givenname: xiangping surname: zhu fullname: zhu, xiangping |
| BookMark | eNp9kM1rGzEQxUVxoXbae6EXQS-9rKOP1e7qGFw7NZgkkLRXMdbOFgVZciX5kP8-azv04ENOAzPvzcz7zcgkxICEfOVszjnT10_r5VwwruZCai1184FMuVJtpXXdTciUibarGKubT2SW8zNjvFZcTcmfdSjovfuLodAHSMVZj3TlfMFEIfR0XTK92e-9s1BcDLREuoKDL_QnFrSnVhzoXQzeBYREH19ywd1n8nEAn_HLW70iv1fLp8WvanN_u17cbCorNSvVwGXX9bLvVSMUR65AtVvbNr0E3rDt0A_ABwGI2NttBz3borAamqEDqBkKeUV-nPfuU_x3wFzMzmU7BoKA8ZANb5lu65o3epR-v5A-x0MK43dmHGshRFcfVeyssinmnHAw--R2kF4MZ-YI2oygzRG0eQM9WpoLi3XlBKskcP4947ez0Y0B_99pmeS1bOUre7KNbw |
| CODEN | ITIED6 |
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| Cites_doi | 10.1109/TSP.2011.2170682 10.1109/TIE.2010.2103533 10.1109/TIE.2012.2219836 10.1049/ip-f-2.1993.0015 10.1016/j.mechatronics.2013.11.009 10.1016/j.jprocont.2012.09.003 10.1080/00949659708811843 10.1109/ISPA.2005.195385 10.1109/TIE.2014.2345331 10.1109/TIE.2011.2167110 10.1109/TCYB.2013.2250955 10.1109/IROS.2005.1545119 10.1109/TII.2012.2198665 10.1080/00207720110102566 10.1109/78.978374 10.1049/el.2010.1633 10.1109/TCST.2011.2172444 10.1002/0470045345 10.1109/TIE.2014.2301773 10.1109/TIE.2012.2230598 10.1109/TAP.2011.2173111 10.1109/78.978396 10.1109/TII.2014.2341934 10.1016/j.compag.2013.10.005 10.1023/A:1008935410038 10.1109/TIE.2012.2183835 10.1016/j.jprocont.2009.07.011 10.1016/j.automatica.2006.11.018 10.1016/j.cor.2013.11.013 10.1109/TII.2012.2214390 10.1109/TSP.2013.2262276 10.1109/TIP.2011.2174370 10.1109/TIE.2011.2162714 10.1109/TSP.2006.870579 10.1111/1467-9868.00280 |
| ContentType | Journal Article |
| Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2015 |
| Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2015 |
| DBID | 97E RIA RIE AAYXX CITATION 7SP 8FD L7M F28 FR3 |
| DOI | 10.1109/TIE.2015.2399396 |
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Engineering Research Database |
| DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts Engineering Research Database ANTE: Abstracts in New Technology & Engineering |
| DatabaseTitleList | Technology Research Database Engineering Research Database |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1557-9948 |
| EndPage | 3861 |
| ExternalDocumentID | 3760030701 10_1109_TIE_2015_2399396 7031437 |
| Genre | orig-research |
| GrantInformation_xml | – fundername: National Natural Science Foundation of China grantid: 61472104; 61304102 ; 61333012 funderid: 10.13039/501100001809 |
| GroupedDBID | -~X .DC 0R~ 29I 4.4 5GY 5VS 6IK 97E 9M8 AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK ACKIV ACNCT AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ H~9 IBMZZ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P RIA RIE RNS TAE TN5 TWZ VH1 VJK AAYXX CITATION 7SP 8FD L7M RIG F28 FR3 |
| ID | FETCH-LOGICAL-c390t-f1388d3dd56251e15a57bc76d3a160bfdfa1f2aeeedcb8ad0be2c9a6f8aa40e23 |
| IEDL.DBID | RIE |
| ISICitedReferencesCount | 329 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000354453600055&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 0278-0046 |
| IngestDate | Sun Nov 09 13:10:33 EST 2025 Mon Jun 30 10:19:25 EDT 2025 Tue Nov 18 22:28:50 EST 2025 Sat Nov 29 01:31:28 EST 2025 Tue Aug 26 16:39:35 EDT 2025 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 6 |
| Keywords | Genetic algorithm (GA) particle filter (PF) intelligent particle filter (IPF) hidden state estimation real-time fault detection |
| Language | English |
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c390t-f1388d3dd56251e15a57bc76d3a160bfdfa1f2aeeedcb8ad0be2c9a6f8aa40e23 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
| PQID | 1699222849 |
| PQPubID | 85464 |
| PageCount | 10 |
| ParticipantIDs | proquest_journals_1699222849 crossref_primary_10_1109_TIE_2015_2399396 proquest_miscellaneous_1709744169 crossref_citationtrail_10_1109_TIE_2015_2399396 ieee_primary_7031437 |
| PublicationCentury | 2000 |
| PublicationDate | 2015-06-01 |
| PublicationDateYYYYMMDD | 2015-06-01 |
| PublicationDate_xml | – month: 06 year: 2015 text: 2015-06-01 day: 01 |
| PublicationDecade | 2010 |
| PublicationPlace | New York |
| PublicationPlace_xml | – name: New York |
| PublicationTitle | IEEE transactions on industrial electronics (1982) |
| PublicationTitleAbbrev | TIE |
| PublicationYear | 2015 |
| Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| References | ref35 ref13 ref34 ref12 ref37 ref15 ref14 ref31 ref33 ref11 ref32 ref10 ref2 ref1 ref17 ref38 ref16 heris (ref19) 0 ref18 douc (ref21) 2005 yin (ref30) 0 ref24 ref23 ref26 ref25 ref20 ding (ref36) 2008 ref22 ref28 ref27 ref29 ref8 ref7 ref9 ref4 ref3 ref6 ref5 |
| References_xml | – ident: ref8 doi: 10.1109/TSP.2011.2170682 – ident: ref33 doi: 10.1109/TIE.2010.2103533 – ident: ref2 doi: 10.1109/TIE.2012.2219836 – ident: ref14 doi: 10.1049/ip-f-2.1993.0015 – ident: ref31 doi: 10.1016/j.mechatronics.2013.11.009 – ident: ref11 doi: 10.1016/j.jprocont.2012.09.003 – ident: ref17 doi: 10.1080/00949659708811843 – start-page: 64 year: 2005 ident: ref21 article-title: comparison of resampling schemes for particle filtering publication-title: ISPA 2005 the 4th International Symposium on Image and Signal Processing and Analysis 2005 ISPA-05 doi: 10.1109/ISPA.2005.195385 – ident: ref28 doi: 10.1109/TIE.2014.2345331 – ident: ref29 doi: 10.1109/TIE.2011.2167110 – ident: ref23 doi: 10.1109/TCYB.2013.2250955 – ident: ref18 doi: 10.1109/IROS.2005.1545119 – ident: ref24 doi: 10.1109/TII.2012.2198665 – ident: ref38 doi: 10.1080/00207720110102566 – ident: ref16 doi: 10.1109/78.978374 – ident: ref7 doi: 10.1049/el.2010.1633 – ident: ref9 doi: 10.1109/TCST.2011.2172444 – ident: ref25 doi: 10.1002/0470045345 – ident: ref35 doi: 10.1109/TIE.2014.2301773 – year: 2008 ident: ref36 publication-title: Model-Based Fault Diagnosis Techniques – ident: ref32 doi: 10.1109/TIE.2012.2230598 – ident: ref22 doi: 10.1109/TAP.2011.2173111 – ident: ref10 doi: 10.1109/78.978396 – start-page: 1 year: 0 ident: ref19 article-title: Non-dominated sorting genetic filter a multi-objective evolutionary particle filter publication-title: Proc Iran Conf Intell Syst – ident: ref26 doi: 10.1109/TII.2014.2341934 – ident: ref6 doi: 10.1016/j.compag.2013.10.005 – ident: ref20 doi: 10.1023/A:1008935410038 – ident: ref37 doi: 10.1109/TIE.2012.2183835 – ident: ref27 doi: 10.1016/j.jprocont.2009.07.011 – ident: ref1 doi: 10.1016/j.automatica.2006.11.018 – ident: ref13 doi: 10.1016/j.cor.2013.11.013 – ident: ref34 doi: 10.1109/TII.2012.2214390 – ident: ref5 doi: 10.1109/TSP.2013.2262276 – ident: ref12 doi: 10.1109/TIP.2011.2174370 – ident: ref4 doi: 10.1109/TIE.2011.2162714 – ident: ref3 doi: 10.1109/TSP.2006.870579 – year: 0 ident: ref30 article-title: Performance monitoring for vehicle suspension system via fuzzy positivistic C-means clustering based on accelerometer measurements publication-title: IEEE/ASME Trans Mechatronics – ident: ref15 doi: 10.1111/1467-9868.00280 |
| SSID | ssj0014515 |
| Score | 2.6073358 |
| Snippet | The particle filter (PF) provides a kind of novel technique for estimating the hidden states of the nonlinear and/or non-Gaussian systems. However, the general... |
| SourceID | proquest crossref ieee |
| SourceType | Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 3852 |
| SubjectTerms | Dynamical systems Equations Fault detection genetic algorithm Genetic algorithms Genetics hidden state estimation Industrial electronics intelligent particle filter Mathematical model Non-Gaussian Nonlinear systems Nonlinearity Particle filter Real time real-time fault detection State estimation Strategy |
| Title | Intelligent Particle Filter and Its Application to Fault Detection of Nonlinear System |
| URI | https://ieeexplore.ieee.org/document/7031437 https://www.proquest.com/docview/1699222849 https://www.proquest.com/docview/1709744169 |
| Volume | 62 |
| WOSCitedRecordID | wos000354453600055&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE Electronic Library (IEL) customDbUrl: eissn: 1557-9948 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014515 issn: 0278-0046 databaseCode: RIE dateStart: 19820101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB5q8aAH32J9sYIXwdhsku7jKNpiQUoPKt7CZHcDgiTSpv5-dzdpLCiCt0A2r5ndnZl8M98AXEqdSaSaBUmUySARJg-QUxlwjcpuf8iF8oXCj3wyEa-vctqB67YWxhjjk8_MjTv0WL4u1cL9Kut7rvWYr8Ea56yu1WoRg2RQdyuIHGOsDfqWkGQo-0_jocvhGty4Os7Y0fOvmCDfU-XHRuyty2j7f--1A1uNF0lua7XvQscUe7C5wi24Dy_jlmyzItNmgpDRm0PHCRaajKs5uf2Gr0lVkhEu3itybyqfn1WQMieTmkoDZ6TmNj-A59Hw6e4haJooBCqWYRXkNBZCx1q7SIcaOsABzxRnOkbKwizXOdI8QvtNWmUCdZiZSElkuUBMQhPFh9AtysIcARGZkImSLFN5bL2sBBlSo4y0Bs46Dob1oL-Ua6oahnHX6OI99ZFGKFOridRpIm000YOr9oqPml3jj7H7TvLtuEboPThdqi5tlt88pczR7VrLK3tw0Z62C8ehIViYcmHH8NDGUtYflce_3_kENtzz67ywU-hWs4U5g3X1Wb3NZ-d-9n0BI7nYsA |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dS8MwED_8AvXBb3F-RvBFsK7pZ_I41LHhHHuY4lu5JikI0srW-febpF0dKIJvhaYlvUtyd_3d_Q7gisuUI5WRE3gpdwKmMgdjyp1YotDHH8ZM2ELhQTwcstdXPlqCm6YWRillk8_Urbm0WL4sxMz8KmtbrnU_XobVMAg8t6rWajCDIKz6FXiGM1aHfXNQ0uXtcf_BZHGFt6aS0zcE_QtGyHZV-XEUW_vS3f7fzHZgq_YjSadS_C4sqXwPNhfYBffhpd_QbZZkVC8R0n0z-DjBXJJ-OSWdbwCblAXp4uy9JPeqtBlaOSkyMqzINHBCKnbzA3juPozvek7dRsERPndLJ6M-Y9KX0sQ6VNEQwzgVcSR9pJGbZjJDmnmov0mKlKF0U-UJjlHGEANXef4hrORFro6AsJTxQPAoFZmv_awAI6RKKK5NnHYdVNSC9lyuiag5xk2ri_fExhouT7QmEqOJpNZEC66bJz4qfo0_xu4byTfjaqG34HSuuqTegNOERoZwV9te3oLL5rbeOgYPwVwVMz0mdnU0pT1Sfvz7my9gvTd-GiSD_vDxBDbMXKossVNYKSczdQZr4rN8m07O7Ur8Ao9k2_c |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Intelligent+Particle+Filter+and+Its+Application+to+Fault+Detection+of+Nonlinear+System&rft.jtitle=IEEE+transactions+on+industrial+electronics+%281982%29&rft.au=Shen+Yin&rft.au=Xiangping+Zhu&rft.date=2015-06-01&rft.pub=IEEE&rft.issn=0278-0046&rft.volume=62&rft.issue=6&rft.spage=3852&rft.epage=3861&rft_id=info:doi/10.1109%2FTIE.2015.2399396&rft.externalDocID=7031437 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0278-0046&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0278-0046&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0278-0046&client=summon |