A 110 GOPS/W 16-bit multiplier and reconfigurable PLA loop in 90-nm CMOS

This paper describes a 16 /spl times/ 16 bit single-cycle 2's complement multiplier with a reconfigurable PLA control block fabricated in 90-nm dual-V/sub t/ CMOS technology, operating at 1 GHz, 9 mW (measured at 1.3 V, 50/spl deg/C). Optimally tiled compressor tree architecture with radix-4 Bo...

Full description

Saved in:
Bibliographic Details
Published in:IEEE journal of solid-state circuits Vol. 41; no. 1; pp. 256 - 264
Main Authors: Hsu, S.K., Mathew, S.K., Anders, M.A., Zeydel, B.R., Oklobdzija, V.G., Krishnamurthy, R.K., Borkar, S.Y.
Format: Journal Article Conference Proceeding
Language:English
Published: New York, NY IEEE 01.01.2006
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
ISSN:0018-9200, 1558-173X
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This paper describes a 16 /spl times/ 16 bit single-cycle 2's complement multiplier with a reconfigurable PLA control block fabricated in 90-nm dual-V/sub t/ CMOS technology, operating at 1 GHz, 9 mW (measured at 1.3 V, 50/spl deg/C). Optimally tiled compressor tree architecture with radix-4 Booth encoding, arrival-profile aware completion adder and low clock power write-port flip-flop circuits enable a dense layout occupying 0.03 mm/sup 2/ while simultaneously achieving: 1) low compressor tree fan-outs and wiring complexity; 2) low active leakage power of 540 /spl mu/W and high noise tolerance with all high-V/sub t/ usage; 3) ultra low standby-mode power of 75 /spl mu/W and fast wake-up time of <1 cycle using PMOS sleep transistors; 4) scalable multiplier performance up to 1.5 GHz, 32 mW measured at 1.95 V, 50/spl deg/C, and (v) low-voltage mode multiplier performance of 50 MHz, 79/spl mu/W measured at 570 mV, 50/spl deg/C.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 14
content type line 23
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.2005.859893