The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy

We describe the development, operation, and application of the 4D Camera-a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at ∼480 Gbit/s which is captured by dedicated receiver computers with a parallelized...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:Microscopy and microanalysis Ročník 30; číslo 5; s. 903
Hlavní autoři: Ercius, Peter, Johnson, Ian J, Pelz, Philipp, Savitzky, Benjamin H, Hughes, Lauren, Brown, Hamish G, Zeltmann, Steven E, Hsu, Shang-Lin, Pedroso, Cassio C S, Cohen, Bruce E, Ramesh, Ramamoorthy, Paul, David, Joseph, John M, Stezelberger, Thorsten, Czarnik, Cory, Lent, Matthew, Fong, Erin, Ciston, Jim, Scott, Mary C, Ophus, Colin, Minor, Andrew M, Denes, Peter
Médium: Journal Article
Jazyk:angličtina
Vydáno: England 04.11.2024
Témata:
4D-STEM
direct electron detector
scanning transmission electron microscopy
phase contrast STEM
active pixel sensor
ISSN:1435-8115, 1435-8115
On-line přístup:Zjistit podrobnosti o přístupu
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:We describe the development, operation, and application of the 4D Camera-a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at ∼480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10-700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 to 300 kV. Through electron counting, the resulting sparse data sets are reduced in size by 10--300× compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex scanning diffraction experiments to be accomplished with typical scanning transmission electron microscopy scanning parameters.
Bibliografie:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1435-8115
1435-8115
DOI:10.1093/mam/ozae086