Simple and fast numerical analysis of multilayer waveguide modes

We propose a new numerical method for exactly determining modes of a general multilayer waveguide. The proposed method has two features: simple implementation and fast calculation. Its implementation is simple since it is based on a complex root-finding algorithm reported recently. This algorithm is...

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Veröffentlicht in:Optics communications Jg. 233; H. 1; S. 119 - 126
Hauptverfasser: Kwon, Min-Suk, Shin, Sang-Yung
Format: Journal Article
Sprache:Englisch
Veröffentlicht: Amsterdam Elsevier B.V 15.03.2004
Elsevier Science
Schlagworte:
Applied sciences
Circuit properties
Complex root-finding algorithm
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Integrated optics. Optical fibers and wave guides
Multilayer waveguide
Optical and optoelectronic circuits
Propagation
Waveguides, couplers, and arrays
02.60.Cb
Complex root-finding algorithm
42.82.−m
Propagation
Multilayer waveguide
Integrated optics
Thin film device
Theoretical study
Optical modes
Multiple layer
Eigenvalue
Optical waveguide
Numerical method
Algorithm
ISSN:0030-4018, 1873-0310
Online-Zugang:Volltext
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Beschreibung
Zusammenfassung:We propose a new numerical method for exactly determining modes of a general multilayer waveguide. The proposed method has two features: simple implementation and fast calculation. Its implementation is simple since it is based on a complex root-finding algorithm reported recently. This algorithm is very intuitive and consists of the process of isolating each zero and that of determining the isolated zeros. To reduce calculation time, we propose and use an efficient scheme for evaluations of the eigenvalue function and its derivative. Using this scheme, we can decrease the number of arithmetic operations necessary for the analysis compared to the existing scheme based on the transfer matrix method. The proposed method is applied to analyze lossless and lossy waveguides and an anti-resonant reflective optical waveguide. The analysis results are compared to those in literatures and the comparisons show good agreement. In addition, it is shown that the proposed method is useful in analyzing the effects of a metal layer or a high index substrate on the integrated optical devices.
ISSN:0030-4018
1873-0310
DOI:10.1016/j.optcom.2004.01.037