The Kirsch-Kress method for inverse scattering by infinite locally rough interfaces

This paper is concerned with the inverse problem of reconstructing an infinite, locally rough interface from the scattered field measured on line segments above and below the interface in two dimensions. We extend the Kirsch-Kress method originally developed for inverse obstacle scattering problems...

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Bibliographic Details
Published in:Applicable analysis Vol. 96; no. 1; pp. 85 - 107
Main Authors: Li, Jianliang, Sun, Guanying, Zhang, Bo
Format: Journal Article
Language:English
Published: Abingdon Taylor & Francis 02.01.2017
Taylor & Francis Ltd
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ISSN:0003-6811, 1563-504X
Online Access:Get full text
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