Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes

One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demodulation of the probe signal. In this contribution, we present the amplitude and phase estimation method based on the acquisition of four points per oscillation, with the sampling frequency being ph...

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Vydáno v:	IEEE transactions on control systems technology Ročník 29; číslo 5; s. 2264 - 2270
Hlavní autoři:	Lagrange, Denis, Mauran, Nicolas, Schwab, Lucien, Legrand, Bernard
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York IEEE 01.09.2021 The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers
Témata:	Actuation Amplitude and phase demodulation Atomic force microscopy atomic force microscopy (AFM) Bandwidth Carrier frequencies Demodulation Electronics Engineering Sciences Field programmable gate arrays field-programmable gate array~(FPGA) implementation Lock in amplifiers Micro and nanotechnologies Microelectronics Microscopes Microscopy Signal and Image processing Sine waves low latency amplitude and phase demodulation field-programmable gate array (FPGA) implementations atomic force microscopy
ISSN:	1063-6536, 1558-0865
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Popis
Shrnutí:	One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demodulation of the probe signal. In this contribution, we present the amplitude and phase estimation method based on the acquisition of four points per oscillation, with the sampling frequency being phase-locked on the probe actuation. The method is implemented on a RedPitaya platform, with its clock being generated from the actuation signal of the probe. Experimental characterizations using square-modulated sine waves show that latency of 500 ns is achieved with a carrier frequency of 10 MHz, which is ten times faster compared with a state-of-the-art lock-in amplifier. A tracking bandwidth greater than 200 kHz is obtained experimentally. The method is eventually applied to a close-loop AFM scan realized using a 15-MHz AFM probe, showing its suitability for high-frequency oscillating probes.
Bibliografie:	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14
ISSN:	1063-6536 1558-0865
DOI:	10.1109/TCST.2020.3028737