Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes

One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demodulation of the probe signal. In this contribution, we present the amplitude and phase estimation method based on the acquisition of four points per oscillation, with the sampling frequency being ph...

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Bibliographic Details
Published in:IEEE transactions on control systems technology Vol. 29; no. 5; pp. 2264 - 2270
Main Authors: Lagrange, Denis, Mauran, Nicolas, Schwab, Lucien, Legrand, Bernard
Format: Journal Article
Language:English
Published: New York IEEE 01.09.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Institute of Electrical and Electronics Engineers
Subjects:
Actuation
Amplitude and phase demodulation
Atomic force microscopy
atomic force microscopy (AFM)
Bandwidth
Carrier frequencies
Demodulation
Electronics
Engineering Sciences
Field programmable gate arrays
field-programmable gate array~(FPGA) implementation
Lock in amplifiers
Micro and nanotechnologies
Microelectronics
Microscopes
Microscopy
Signal and Image processing
Sine waves
low latency
amplitude and phase demodulation
field-programmable gate array (FPGA) implementations
atomic force microscopy
ISSN:1063-6536, 1558-0865
Online Access:Get full text
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Summary:One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demodulation of the probe signal. In this contribution, we present the amplitude and phase estimation method based on the acquisition of four points per oscillation, with the sampling frequency being phase-locked on the probe actuation. The method is implemented on a RedPitaya platform, with its clock being generated from the actuation signal of the probe. Experimental characterizations using square-modulated sine waves show that latency of 500 ns is achieved with a carrier frequency of 10 MHz, which is ten times faster compared with a state-of-the-art lock-in amplifier. A tracking bandwidth greater than 200 kHz is obtained experimentally. The method is eventually applied to a close-loop AFM scan realized using a 15-MHz AFM probe, showing its suitability for high-frequency oscillating probes.
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ISSN:1063-6536
1558-0865
DOI:10.1109/TCST.2020.3028737