Optimal Path Planning in Complex Cost Spaces With Sampling-Based Algorithms

Sampling-based algorithms for path planning, such as the Rapidly-exploring Random Tree (RRT), have achieved great success, thanks to their ability to efficiently solve complex high-dimensional problems. However, standard versions of these algorithms cannot guarantee optimality or even high-quality f...

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Veröffentlicht in:IEEE transactions on automation science and engineering Jg. 13; H. 2; S. 415 - 424
Hauptverfasser: Devaurs, Didier, Simeon, Thierry, Cortes, Juan
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York IEEE 01.04.2016
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Institute of Electrical and Electronics Engineers
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ISSN:1545-5955, 1558-3783
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Zusammenfassung:Sampling-based algorithms for path planning, such as the Rapidly-exploring Random Tree (RRT), have achieved great success, thanks to their ability to efficiently solve complex high-dimensional problems. However, standard versions of these algorithms cannot guarantee optimality or even high-quality for the produced paths. In recent years, variants of these methods, such as T-RRT, have been proposed to deal with cost spaces: by taking configuration-cost functions into account during the exploration process, they can produce high-quality (i.e., low-cost) paths. Other novel variants, such as RRT*, can deal with optimal path planning: they ensure convergence toward the optimal path, with respect to a given path-quality criterion. In this paper, we propose to solve a complex problem encompassing this two paradigms: optimal path planning in a cost space. For that, we develop two efficient sampling-based approaches that combine the underlying principles of RRT* and T-RRT. These algorithms, called T-RRT* and AT-RRT, offer the same asymptotic optimality guarantees as RRT*. Results presented on several classes of problems show that they converge faster than RRT* toward the optimal path, especially when the topology of the search space is complex and/or when its dimensionality is high.
Bibliographie:SourceType-Scholarly Journals-1
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content type line 14
ISSN:1545-5955
1558-3783
DOI:10.1109/TASE.2015.2487881