Bit-Reliability Based Low-Complexity Decoding Algorithms for Non-Binary LDPC Codes

This paper presents bit-reliability based majority-logic decoding (MLgD) algorithms for non-binary LDPC codes. The proposed algorithms pass only one Galois field element and its reliability along each edge of the Tanner graph of a non-binary LDPC code. Since their reliability updates are in terms of...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on communications Vol. 62; no. 12; pp. 4230 - 4240
Main Authors: Huang, Qin, Zhang, Mu, Wang, Zulin, Wang, Lu
Format: Journal Article
Language:English
Published: New York IEEE 01.12.2014
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
binary representation
bit-reliability
Computational complexity
Decoding
Hamming distance
Iterative decoding
majority-logic decoding
Non-binary LDPC codes
Parity check codes
Non-binary LDPC codes
majority-logic decoding
binary representation
bit-reliability
hamming distance
ISSN:0090-6778, 1558-0857
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This paper presents bit-reliability based majority-logic decoding (MLgD) algorithms for non-binary LDPC codes. The proposed algorithms pass only one Galois field element and its reliability along each edge of the Tanner graph of a non-binary LDPC code. Since their reliability updates are in terms of bits rather than symbols, they are more efficient than traditional MLgD based decoding algorithms. By weighting the soft reliability of the extrinsic information-sums based on their hard reliability, the proposed algorithms can achieve good error performance for non-binary LDPC codes with various column weights. Moreover, their computational complexity and memory consumption are remarkably reduced compared with existing MLgD based decoding algorithms. As a result, they provide effective tradeoffs between error performance and complexity for decoding of non-binary LDPC codes.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:0090-6778
1558-0857
DOI:10.1109/TCOMM.2014.2370032