A 10-Year Comparison of Water Levels Measured with a Geodetic GPS Receiver Versus a Conventional Tide Gauge

A standard geodetic GPS receiver and a conventional Aquatrak tide gauge, collocated at Friday Harbor, Washington, are used to assess the quality of 10 years of water levels estimated from GPS sea surface reflections.The GPS results are improved by accounting for (tidal) motion of the reflecting sea...

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Veröffentlicht in:Journal of atmospheric and oceanic technology Jg. 34; H. 2; S. 295 - 307
Hauptverfasser: Larson, Kristine M., Ray, Richard D., Williams, Simon D. P.
Format: Journal Article
Sprache:Englisch
Veröffentlicht: Goddard Space Flight Center American Meteorological Society 01.02.2017
Schlagworte:
ISSN:0739-0572, 1520-0426
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Zusammenfassung:A standard geodetic GPS receiver and a conventional Aquatrak tide gauge, collocated at Friday Harbor, Washington, are used to assess the quality of 10 years of water levels estimated from GPS sea surface reflections.The GPS results are improved by accounting for (tidal) motion of the reflecting sea surface and for signal propagation delay by the troposphere. The RMS error of individual GPS water level estimates is about 12 cm. Lower water levels are measured slightly more accurately than higher water levels. Forming daily mean sea levels reduces the RMS difference with the tide gauge data to approximately 2 cm. For monthly means, the RMS difference is 1.3 cm. The GPS elevations, of course, can be automatically placed into a well-defined terrestrial reference frame. Ocean tide coefficients, determined from both the GPS and tide gauge data, are in good agreement, with absolute differences below 1 cm for all constituents save K1 and S1. The latter constituent is especially anomalous, probably owing to daily temperature-induced errors in the Aquatrak tide gauge
Bibliographie:Report Number: GSFC-E-DAA-TN45569
GSFC
ISSN: 0739-0572
E-ISSN: 1520-0426
GSFC-E-DAA-TN45569
Goddard Space Flight Center
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SourceType-Scholarly Journals-1
ObjectType-Feature-2
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ISSN:0739-0572
1520-0426
DOI:10.1175/JTECH-D-16-0101.1