Unraveling thickness-dependent structural properties of CrSBr nanoflakes using hyperspectral TERS imaging

CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thickness-dependent structural and electronic behavior remains limited. In this study, we empl...

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Vydané v:Optics communications Ročník 595; s. 132349
Hlavní autori: Danylo, Iryna, Mrđenović, Dušan, Bienz, Siiri, Zenobi, Renato, Sofer, Zdeněk, Kumar, Naresh, Veselý, Martin
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: Elsevier B.V 01.12.2025
Predmet:
CrSBr nanoflakes
Energy band structure
Hyperspectral imaging
Tip-enhanced Raman spectroscopy
Two-dimensional semiconductor
CrSBr nanoflakes
Energy band structure
Tip-enhanced Raman spectroscopy
Hyperspectral imaging
Two-dimensional semiconductor
ISSN:0030-4018
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Shrnutí:CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thickness-dependent structural and electronic behavior remains limited. In this study, we employ hyperspectral tip-enhanced Raman spectroscopy (TERS) imaging to investigate the vibrational and electronic properties of exfoliated CrSBr nanoflakes. Both confocal Raman and TERS measurements reveal a systematic enhancement of the A2g Raman mode relative to the A3g mode in thinner flakes. The I (A2g)/I (A3g) intensity ratio decreases consistently with increasing flake thickness, reflecting underlying changes in the electronic band structure. Hyperspectral TERS mapping confirms this trend at the single-flake level and suggests a resonance Raman enhancement influenced by electron–phonon coupling near the band edge. Our results establish the I (A2g)/I (A3g) ratio as a sensitive spectroscopic marker for thickness-dependent band structure evolution in CrSBr. More broadly, this work highlights hyperspectral TERS as a powerful tool for probing local structure–property relationships in emerging low-dimensional materials. [Display omitted]
ISSN:0030-4018
DOI:10.1016/j.optcom.2025.132349