Unraveling thickness-dependent structural properties of CrSBr nanoflakes using hyperspectral TERS imaging

CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thickness-dependent structural and electronic behavior remains limited. In this study, we empl...

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Vydané v:	Optics communications Ročník 595; s. 132349
Hlavní autori:	Danylo, Iryna, Mrđenović, Dušan, Bienz, Siiri, Zenobi, Renato, Sofer, Zdeněk, Kumar, Naresh, Veselý, Martin
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Elsevier B.V 01.12.2025
Predmet:	CrSBr nanoflakes Energy band structure Hyperspectral imaging Tip-enhanced Raman spectroscopy Two-dimensional semiconductor CrSBr nanoflakes Energy band structure Tip-enhanced Raman spectroscopy Hyperspectral imaging Two-dimensional semiconductor
ISSN:	0030-4018
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