Unraveling thickness-dependent structural properties of CrSBr nanoflakes using hyperspectral TERS imaging

CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thickness-dependent structural and electronic behavior remains limited. In this study, we empl...

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Bibliographic Details

Published in:	Optics communications Vol. 595; p. 132349
Main Authors:	Danylo, Iryna, Mrđenović, Dušan, Bienz, Siiri, Zenobi, Renato, Sofer, Zdeněk, Kumar, Naresh, Veselý, Martin
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01.12.2025
Subjects:	CrSBr nanoflakes Energy band structure Hyperspectral imaging Tip-enhanced Raman spectroscopy Two-dimensional semiconductor CrSBr nanoflakes Energy band structure Tip-enhanced Raman spectroscopy Hyperspectral imaging Two-dimensional semiconductor
ISSN:	0030-4018
Online Access:	Get full text
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