A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm

The reliability allowance of circuits tends to decrease with the increase of circuit integration and the application of new technology and materials, and the hardening strategy oriented toward gates is an effective technology for improving the circuit reliability of the current situations. Therefore...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:Journal of computer science and technology Ročník 34; číslo 5; s. 1136 - 1151
Hlavní autoři: Xiao, Jie, Shi, Zhan-Hui, Jiang, Jian-Hui, Yang, Xu-Hua, Huang, Yu-Jiao, Hu, Hai-Gen
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York Springer US 01.09.2019
Springer Nature B.V
College of Computer Science and Technology, Zhejiang University of Technology, Hangzhou 310023, China%School of Software Engineering, Tongji University, Shanghai 201804, China
Témata:
Artificial Intelligence
Binary codes
Circuit reliability
Computer Science
Convergence
Data Structures and Information Theory
Gates (circuits)
Genetic algorithms
Hardening
Identification methods
Information Systems Applications (incl.Internet)
New technology
Optimization
Parallel operation
Regular Paper
Software Engineering
Theory of Computation
locating reliability-critical gate
scoring mechanism
gate-level circuit reliability
directing strategy
parallel-structured genetic algorithm
ISSN:1000-9000, 1860-4749
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:The reliability allowance of circuits tends to decrease with the increase of circuit integration and the application of new technology and materials, and the hardening strategy oriented toward gates is an effective technology for improving the circuit reliability of the current situations. Therefore, a parallel-structured genetic algorithm (GA), PGA, is proposed in this paper to locate reliability-critical gates to successfully perform targeted hardening. Firstly, we design a binary coding method for reliability-critical gates and build an ordered initial population consisting of dominant individuals to improve the quality of the initial population. Secondly, we construct an embedded parallel operation loop for directional crossover and directional mutation to compensate for the deficiency of the poor local search of the GA. Thirdly, for combination with a diversity protection strategy for the population, we design an elitism retention based selection method to boost the convergence speed and avoid being trapped by a local optimum. Finally, we present an ordered identification method oriented toward reliability-critical gates using a scoring mechanism to retain the potential optimal solutions in each round to improve the robustness of the proposed locating method. The simulation results on benchmark circuits show that the proposed method PGA is an efficient locating method for reliability-critical gates in terms of accuracy and convergence speed.
Bibliografie:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:1000-9000
1860-4749
DOI:10.1007/s11390-019-1965-1