Simplified Birthday Statistics and Hamming EDAC

Space systems use error detection and correction (EDAC) schemes to protect memory contents from single event upsets (SEUs). Hamming EDAC is the preferred scheme for fast, random access memories. It allows for the correction of a single bit error within a word and the detection of a double bit error....

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Vydané v:IEEE transactions on nuclear science Ročník 56; číslo 2; s. 474 - 478
Hlavný autor: Tausch, H.J.
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: New York IEEE 01.04.2009
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Predmet:
Equations
Error correction
Error correction codes
Error detection
error detection coding
Errors
Event detection
Hamming codes
integrated circuit radiation effects
Mathematical analysis
memory architecture
memory fault tolerance
Permissible error
Protection
Radiation effects
Random access memory
Single event transient
Single event upset
Single event upsets
Statistics
ISSN:0018-9499, 1558-1578
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Popis
Shrnutí:Space systems use error detection and correction (EDAC) schemes to protect memory contents from single event upsets (SEUs). Hamming EDAC is the preferred scheme for fast, random access memories. It allows for the correction of a single bit error within a word and the detection of a double bit error. The common assumption is that the likelihood of an uncorrectable double bit error is very small. This paper develops a simple equation that predicts the cumulative probability of a double bit error occurring within some word of Hamming protected memory as the number of random upsets increase and shows how it can be used to better understand the protection provided by EDAC.
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ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2009.2012710