Adaptive Hierarchical Similarity Metric Learning with Noisy Labels

Deep Metric Learning (DML) plays a critical role in various machine learning tasks. However, most existing deep metric learning methods with binary similarity are sensitive to noisy labels, which are widely present in real-world data. Since these noisy labels often cause a severe performance degrada...

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Veröffentlicht in:IEEE transactions on image processing Jg. 32; S. 1
Hauptverfasser: Yan, Jiexi, Luo, Lei, Deng, Cheng, Huang, Heng
Format: Journal Article
Sprache:Englisch
Veröffentlicht: United States IEEE 01.01.2023
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:1057-7149, 1941-0042, 1941-0042
Online-Zugang:Volltext
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