Calibration-less direct capacitor-to-microcontroller interface
A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor-to-microcontroller interface circuit that does not need a calibration capacitor is proposed. Basically, the measurement process consists of three consecutive steps of charge, discharge and charge of the capacit...
Saved in:
| Published in: | Electronics letters Vol. 52; no. 4; pp. 289 - 291 |
|---|---|
| Main Authors: | , , |
| Format: | Journal Article Publication |
| Language: | English |
| Published: |
The Institution of Engineering and Technology
18.02.2016
Institution of Electrical Engineers |
| Subjects: | |
| ISSN: | 0013-5194, 1350-911X, 1350-911X |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Abstract | A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor-to-microcontroller interface circuit that does not need a calibration capacitor is proposed. Basically, the measurement process consists of three consecutive steps of charge, discharge and charge of the capacitor under test. A non-linear equation is obtained and solved that is dependent only on known circuit parameters. Experimental results show that it is possible to measure a wide range of capacitor values with a maximum deviation of 2% from the reference value, and that temperature changes from 18 to 70°C yield relative errors below 0.1%. For the lowest measured capacitor range (33 pF–4.7 nF) the uncertainty holds below 1 pF which enables measurement of commercially available capacitive sensors. The main advantage of the proposed technique is cost and space reduction of the final design. |
|---|---|
| AbstractList | A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor‐to‐microcontroller interface circuit that does not need a calibration capacitor is proposed. Basically, the measurement process consists of three consecutive steps of charge, discharge and charge of the capacitor under test. A non‐linear equation is obtained and solved that is dependent only on known circuit parameters. Experimental results show that it is possible to measure a wide range of capacitor values with a maximum deviation of 2% from the reference value, and that temperature changes from 18 to 70°C yield relative errors below 0.1%. For the lowest measured capacitor range (33 pF–4.7 nF) the uncertainty holds below 1 pF which enables measurement of commercially available capacitive sensors. The main advantage of the proposed technique is cost and space reduction of the final design. A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor-to-microcontroller interface circuit that does not need a calibration capacitor is proposed. Basically, the measurement process consists of three consecutive steps of charge, discharge and charge of the capacitor under test. A non-linear equation is obtained and solved that is dependent only on known circuit parameters. Experimental results show that it is possible to measure a wide range of capacitor values with a maximum deviation of 2% from the reference value, and that temperature changes from 18 to 70°C yield relative errors below 0.1%. For the lowest measured capacitor range (33 pF-4.7 nF) the uncertainty holds below 1 pF which enables measurement of commercially available capacitive sensors. The main advantage of the proposed technique is cost and space reduction of the final design. Peer Reviewed A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor-to-microcontroller interface circuit that does not need a calibration capacitor is proposed. Basically, the measurement process consists of three consecutive steps of charge, discharge and charge of the capacitor under test. A non-linear equation is obtained and solved that is dependent only on known circuit parameters. Experimental results show that it is possible to measure a wide range of capacitor values with a maximum deviation of 2% from the reference value, and that temperature changes from 18 to 70[degrees]C yield relative errors below 0.1%. For the lowest measured capacitor range (33 pF-4.7 nF) the uncertainty holds below 1 pF which enables measurement of commercially available capacitive sensors. The main advantage of the proposed technique is cost and space reduction of the final design. A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor-to-microcontroller interface circuit that does not need a calibration capacitor is proposed. Basically, the measurement process consists of three consecutive steps of charge, discharge and charge of the capacitor under test. A non-linear equation is obtained and solved that is dependent only on known circuit parameters. Experimental results show that it is possible to measure a wide range of capacitor values with a maximum deviation of 2% from the reference value, and that temperature changes from 18 to 70°C yield relative errors below 0.1%. For the lowest measured capacitor range (33 pF–4.7 nF) the uncertainty holds below 1 pF which enables measurement of commercially available capacitive sensors. The main advantage of the proposed technique is cost and space reduction of the final design. |
| Author | Casas, O Lopez-Lapeña, O Serrano-Finetti, E |
| Author_xml | – sequence: 1 givenname: O surname: Lopez-Lapeña fullname: Lopez-Lapeña, O organization: Department of Electronic Engineering, Instrumentation, Sensors and Interfaces Group, EETAC, Universitat Politècnica de Catalunya, C/Esteve Terradas, 7, Castelldefel, Barcelona, Spain – sequence: 2 givenname: E orcidid: 0000-0002-5628-5426 surname: Serrano-Finetti fullname: Serrano-Finetti, E organization: Department of Electronic Engineering, Instrumentation, Sensors and Interfaces Group, EETAC, Universitat Politècnica de Catalunya, C/Esteve Terradas, 7, Castelldefel, Barcelona, Spain – sequence: 3 givenname: O surname: Casas fullname: Casas, O email: jaime.oscar.casas@upc.edu organization: Department of Electronic Engineering, Instrumentation, Sensors and Interfaces Group, EETAC, Universitat Politècnica de Catalunya, C/Esteve Terradas, 7, Castelldefel, Barcelona, Spain |
| BookMark | eNp9kE1rGzEQhkVJoW6aW3-ADzn00HU00khrXQqtyRcYemmhN6HVzoKCvHIlmZJ_n904kLS0PQxi4HlHM89bdjKmkRh7D3wFHM0FxZXgoFay5foVW4BUvDEAP07YgnOQjQKDb9hZKaHjgICaIyzYp42LocuuhjQ2kUpZ9iGTr0vv9s6HmnJTU7MLPiefxppTjJSXYayUB-fpHXs9uFjo7Ok9Zd-vLr9tbprt1-vbzedt4yWueSNI68FxKckMvUHXtbpFWqPBNfS6c9CT6_wglSGDg0A_HSR67xRiL70mecrgONeXg7fTgpS9qza58NzMJXgrrGhBG5wyH46ZfU4_D1Sq3YXiKUY3UjoUC2uhlNIoZvTj0_icSsk02H0OO5fvLXA727UU7WzXznYnXPyBT6YeFdbsQvxXSB1Dv0Kk-_9-YC-3W_Hlikts-ZQ7P-YCVXuXDnmcRE_EC3zfD8_X_ob9dZMHO9eoAQ |
| CitedBy_id | crossref_primary_10_1109_JSEN_2019_2917029 crossref_primary_10_1109_TIM_2022_3220296 crossref_primary_10_11144_Javeriana_iyu26_islc crossref_primary_10_1016_j_measurement_2020_107547 crossref_primary_10_1016_j_measurement_2023_113512 crossref_primary_10_1007_s00779_020_01472_6 crossref_primary_10_1109_TIM_2024_3440404 crossref_primary_10_1109_JSEN_2020_3032828 crossref_primary_10_1109_TIM_2019_2928348 crossref_primary_10_1016_j_measurement_2023_113250 crossref_primary_10_1109_TIM_2017_2771955 crossref_primary_10_1109_TIM_2023_3282266 |
| Cites_doi | 10.1109/TIM.1983.4315071 10.1016/j.measurement.2014.03.011 10.1016/j.sna.2012.02.048 10.1109/19.6050 |
| ContentType | Journal Article Publication |
| Contributor | Universitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| Contributor_xml | – sequence: 1 fullname: Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica – sequence: 2 fullname: Universitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies |
| Copyright | The Institution of Engineering and Technology 2020 The Institution of Engineering and Technology info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by-nc-nd/3.0/es |
| Copyright_xml | – notice: The Institution of Engineering and Technology – notice: 2020 The Institution of Engineering and Technology – notice: info:eu-repo/semantics/openAccess <a href="http://creativecommons.org/licenses/by-nc-nd/3.0/es/">http://creativecommons.org/licenses/by-nc-nd/3.0/es/</a> |
| DBID | AAYXX CITATION 7SP 8FD F28 FR3 L7M XX2 |
| DOI | 10.1049/el.2015.3706 |
| DatabaseName | CrossRef Electronics & Communications Abstracts Technology Research Database ANTE: Abstracts in New Technology & Engineering Engineering Research Database Advanced Technologies Database with Aerospace Recercat |
| DatabaseTitle | CrossRef Engineering Research Database Technology Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Electronics & Communications Abstracts |
| DatabaseTitleList | CrossRef Engineering Research Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1350-911X |
| EndPage | 291 |
| ExternalDocumentID | oai_recercat_cat_2072_271694 10_1049_el_2015_3706 ELL2BF03470 |
| Genre | rapidPublication |
| GroupedDBID | 0R 24P 29G 4IJ 5GY 6IK 8VB AAJGR ABPTK ABZEH ACGFS ACIWK AENEX ALMA_UNASSIGNED_HOLDINGS BFFAM CS3 DU5 ESX F5P HZ IFIPE IPLJI JAVBF KBT LAI LOTEE LXI LXO LXU M43 MS NADUK NXXTH O9- OCL P2P QWB RIE RNS RUI TN5 U5U UNMZH UNR WH7 X ZL0 ZZ -4A -~X .DC 0R~ 0ZK 1OC 2QL 3EH 4.4 8FE 8FG 96U AAHHS AAHJG ABJCF ABQXS ACCFJ ACCMX ACESK ACGFO ACXQS ADEYR ADIYS ADZOD AEEZP AEGXH AEQDE AFAZI AFKRA AI. AIAGR AIWBW AJBDE ALUQN ARAPS AVUZU BBWZM BENPR BGLVJ CCPQU EBS EJD ELQJU F8P GOZPB GROUPED_DOAJ GRPMH HCIFZ HZ~ IAO IFBGX ITC K1G K7- L6V M7S MCNEO MS~ OK1 P0- P62 PTHSS R4Z RIG VH1 ~ZZ AAMMB AAYXX AEFGJ AFFHD AGXDD AIDQK AIDYY CITATION IDLOA PHGZM PHGZT PQGLB WIN 7SP 8FD F28 FR3 L7M XX2 |
| ID | FETCH-LOGICAL-c3480-2e66fa033e9fd94ab7674e849481d6ba1deabcf359e94f24c0492dca544d3c6e3 |
| IEDL.DBID | 24P |
| ISICitedReferencesCount | 13 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000369863000020&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 0013-5194 1350-911X |
| IngestDate | Fri Nov 07 13:51:07 EST 2025 Wed Oct 01 13:01:56 EDT 2025 Wed Oct 29 21:10:21 EDT 2025 Tue Nov 18 22:23:36 EST 2025 Wed Jan 22 16:59:07 EST 2025 Thu May 09 18:26:49 EDT 2019 Tue Jan 05 21:52:53 EST 2021 |
| IsDoiOpenAccess | true |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 4 |
| Keywords | cost reduction capacitor charge capacitive sensors space reduction nonlinear equations capacitive sensor capacitors capacitance 33 nF to 4.7 nF direct sensor-to-microcontroller interface circuit measurement process reference value capacitor measurement electron device testing calibrationless direct capacitor-to-microcontroller interface capacitor discharge temperature 18 degC to 70 degC capacitance measurement nonlinear equation microcontrollers |
| Language | English |
| License | http://onlinelibrary.wiley.com/termsAndConditions#vor |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c3480-2e66fa033e9fd94ab7674e849481d6ba1deabcf359e94f24c0492dca544d3c6e3 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
| ORCID | 0000-0002-5628-5426 |
| OpenAccessLink | https://recercat.cat/handle/2072/271694 |
| PQID | 1825556424 |
| PQPubID | 23500 |
| PageCount | 3 |
| ParticipantIDs | proquest_miscellaneous_1825556424 crossref_primary_10_1049_el_2015_3706 iet_journals_10_1049_el_2015_3706 wiley_primary_10_1049_el_2015_3706_ELL2BF03470 csuc_recercat_oai_recercat_cat_2072_271694 crossref_citationtrail_10_1049_el_2015_3706 |
| ProviderPackageCode | RUI |
| PublicationCentury | 2000 |
| PublicationDate | 2016-02-18 |
| PublicationDateYYYYMMDD | 2016-02-18 |
| PublicationDate_xml | – month: 02 year: 2016 text: 2016-02-18 day: 18 |
| PublicationDecade | 2010 |
| PublicationTitle | Electronics letters |
| PublicationYear | 2016 |
| Publisher | The Institution of Engineering and Technology Institution of Electrical Engineers |
| Publisher_xml | – name: The Institution of Engineering and Technology – name: Institution of Electrical Engineers |
| References | Kokolanski, Z.; Gavroski, C.; Dimcev, V. (C5) 2014; 53 Bengtsson, L. (C4) 2012; 179 Hagiwara, N.; Saegusa, T. (C1) 1983; 32 Mahmud, S.M.; Rusek, A. (C2) 1988; 37 1983; 32 2004 1988; 37 2012; 179 2014; 53 e_1_2_5_3_1 e_1_2_5_2_1 e_1_2_5_6_1 Reverter F. (e_1_2_5_4_1) 2004 e_1_2_5_5_1 |
| References_xml | – volume: 179 start-page: 105 year: 2012 end-page: 113 ident: C4 article-title: Direct analog-to-microcontroller interfacing publication-title: Sensor. Actuat. A, Phys. – volume: 37 start-page: 191 issue: 2 year: 1988 end-page: 194 ident: C2 article-title: A microprocessor-based switched-battery capacitance meter publication-title: IEEE Trans. Instrum. Meas. – volume: 32 start-page: 316 issue: 2 year: 1983 end-page: 321 ident: C1 article-title: An RC discharge digital capacitance meter publication-title: IEEE Trans. Instrum. Meas. – volume: 53 start-page: 22 year: 2014 end-page: 29 ident: C5 article-title: Modified single point calibration with improved accuracy in direct sensor-to-microcontroller interfaces publication-title: Measurement – volume: 37 start-page: 191 issue: 2 year: 1988 end-page: 194 article-title: A microprocessor‐based switched‐battery capacitance meter publication-title: IEEE Trans. Instrum. Meas. – volume: 32 start-page: 316 issue: 2 year: 1983 end-page: 321 article-title: An RC discharge digital capacitance meter publication-title: IEEE Trans. Instrum. Meas. – start-page: 1771 year: 2004 end-page: 1775 – volume: 179 start-page: 105 year: 2012 end-page: 113 article-title: Direct analog‐to‐microcontroller interfacing publication-title: Sensor. Actuat. A, Phys. – volume: 53 start-page: 22 year: 2014 end-page: 29 article-title: Modified single point calibration with improved accuracy in direct sensor‐to‐microcontroller interfaces publication-title: Measurement – ident: e_1_2_5_2_1 doi: 10.1109/TIM.1983.4315071 – ident: e_1_2_5_6_1 doi: 10.1016/j.measurement.2014.03.011 – start-page: 1771 volume-title: A low‐cost microcontroller interface for low‐value capacitive sensors year: 2004 ident: e_1_2_5_4_1 – ident: e_1_2_5_5_1 doi: 10.1016/j.sna.2012.02.048 – ident: e_1_2_5_3_1 doi: 10.1109/19.6050 |
| SSID | ssib014146041 ssj0012997 |
| Score | 2.2342908 |
| Snippet | A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor-to-microcontroller interface circuit that does not need a calibration... A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor‐to‐microcontroller interface circuit that does not need a calibration... |
| SourceID | csuc proquest crossref wiley iet |
| SourceType | Open Access Repository Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 289 |
| SubjectTerms | Calibration calibrationless direct capacitor-to-microcontroller interface capacitance 33 nF to 4.7 nF capacitance 33 nF to 4.7 nF capacitance measurement capacitive sensor capacitive sensors capacitor charge capacitor discharge capacitor measurement Capacitors Charge Circuits cost reduction Detectors Deviation direct sensor-to-microcontroller interface circuit electron device testing Electronics Enginyeria electrònica Instrumentation and measurement Mathematical analysis measurement process Microcontroladors Microcontrollers nonlinear equation nonlinear equations reference value Sensors space reduction temperature 18 degC to 70 degC Àrees temàtiques de la UPC |
| Title | Calibration-less direct capacitor-to-microcontroller interface |
| URI | http://digital-library.theiet.org/content/journals/10.1049/el.2015.3706 https://onlinelibrary.wiley.com/doi/abs/10.1049%2Fel.2015.3706 https://www.proquest.com/docview/1825556424 https://recercat.cat/handle/2072/271694 |
| Volume | 52 |
| WOSCitedRecordID | wos000369863000020&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVWIB databaseName: Wiley Online Library Free Content customDbUrl: eissn: 1350-911X dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0012997 issn: 0013-5194 databaseCode: WIN dateStart: 20130101 isFulltext: true titleUrlDefault: https://onlinelibrary.wiley.com providerName: Wiley-Blackwell – providerCode: PRVWIB databaseName: Wiley Online Library Open Access - NZ customDbUrl: eissn: 1350-911X dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0012997 issn: 0013-5194 databaseCode: 24P dateStart: 20130101 isFulltext: true titleUrlDefault: https://authorservices.wiley.com/open-science/open-access/browse-journals.html providerName: Wiley-Blackwell |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1LT9wwELbQlgMcSoGiLpQqSHBplTaxnTg-IgoCCa04gLo3y4-JhLTsomyWMz-B38gvYSYJy-6BSlUPiRTHnvgxD8cef8PYIQSVgXMhRluVx2ivRexcmcWqlKFwXuvA22ATajAohkN91S240VmYFh9ivuBGktHoaxJw69ooJDippUGkjYM0-ykUIW5_SFOhiKu5vJrvIqCqbYKriCwhoR52ju9Y_tdi6SWT1PPTmUdDcwv10qRzcera2J6zjf-t9Sf2sZt1Rsctm2yyFRhvsfUFLMJt9ptOabmWH54fn0aoAaPW3kUeDapHya8wvZ7g7Y68-Don9xFUEWFOVKX18JndnJ1en5zHXYiF2AtZJDGHPC9tIgToMmhpHWH7QEGYMWnInU0DWOdLkWnQsuTSYyt48DaTMgifg9hhvfFkDF9YlEFInEqAe2pqYYsc9RdHClnQVnnbZz9ee9n4Dn-cwmCMTLMPLrWBkaG-MdQ3fXY0z33f4m68k-87DZjB7oDK29oQXPb8gS6eKG44gQLJPjvAYTWdlE7fIbi_lOf08u2duQ8l0nhlCoOSSNsrdgyTGVLDn21keMnxOy0P_LXmSPmSk_-9VMnuvxbYY2uY3riPp8VX1qurGeyzVf9Q306rb40U4P3PxeAFBAMJlA |
| linkProvider | Wiley-Blackwell |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1LT9tAEF5VoRLlQFsoIkBaI8GFyuDsrh97rFoQiDTiAFJuq32MJaSQIMfhzE_gN_JLmLGdkBxAqnqwJdu7433MYx-z3zB2AD6NwVofoq1KQrTXIrQ2j8M0lz6zTinP62ATab-fDQbqqolzSmdhanyI-YIbSUalr0nAaUG6nnBKAskE2jnoxsciJcjtFYmGhkIYcHk130ZAXVtFVxFxRFI9aDzfMf_JYu4lm9Ryk6lDS3ML5dKoc3HsWhmfs8__XewvbL0Zdwa_akb5yj7AaIOtLaARbrI_dE7L1hzx_Pg0RB0Y1BYvcGhSHcp-ge_LMd7uyI-vcXMfQhEQ6kSRGwff2M3Z6fXv87AJshA6IbMo5JAkuYmEAJV7JY0ldB_ICDWm6xNruh6MdbmIFSiZc-mwFtw7E0vphUtAbLHWaDyCbRbE4CObRsAdVTUzWYIajCOF2CuTOtNmP2fNrF2DQE6BMIa62gmXSsNQU9toaps2O5ynvq-RN95Id0Q9prE5oHCm1ASYPX-gi0cp15xggWSb7WO_6kZOJ28Q7CylOe29ftP3PkcaM67QKIu0wWJGMJ4iNZxuI8tLjv-pmeDdkiPlHicPfJlGO_-a4QdbPb_-29O9i_7lLvuEaSpn8m62x1plMYUO--geyttJ8b0SiRd6owxn |
| linkToPdf | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1LT9tAEF5VoUJwoC2lIlBaVyqXVm6dfdjeIwKiIqIohyLlttrHWEJKE-Q4Pfcn8Bv5JczYJiQHkCoOtmR7d7zenceuZ_Ybxr5CyBQ4F2K0VWmM9lrEzhUqzgoZcue1DrxJNpENh_l4rEdtnlPaC9PgQyx_uJFk1PqaBBxuQtEsOCWBZAJ5Dnrqh8gIcntDKlSzBO0sR0s3AuraOruKUAlJ9biNfMf6P1drr9mkjp8vPFqaa6jWZp2rc9fa-PTfvLjZb9lOO--MThpGecdewXSXba-gEb5nZ7RPyzUccffvdoI6MGosXuTRpHqU_RLvVzM8_aE4vjbMfQJlRKgTZWE97LGr_vnv019xm2Qh9kLmScwhTQubCAG6CFpaR-g-kBNqTC-kzvYCWOcLoTRoWXDp8St48FZJGYRPQXxgnelsCvssUhASlyXAPX1qbvMUNRhHCipom3nbZd8futn4FoGcEmFMTO0Jl9rAxFDfGOqbLjtelr5pkDeeKPeNRsxgd0DpbWUIMHt5QQdPMm44wQLJLvuC42paOZ0_QfBorcz54PGZwbFEGg9cYVAWycFipzBbIDVcbiPLS47vaZjg2ZYj5QGnCHyZJQf_W-Ez2xyd9c3gYnh5yLawSB1L3ss_sk5VLuCIvfZ_q-t5-amWiHsPDgvr |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Calibration%E2%80%90less+direct+capacitor%E2%80%90to%E2%80%90microcontroller+interface&rft.jtitle=Electronics+letters&rft.au=Lopez%E2%80%90Lape%C3%B1a%2C+O.&rft.au=Serrano%E2%80%90Finetti%2C+E.&rft.au=Casas%2C+O.&rft.date=2016-02-18&rft.issn=0013-5194&rft.eissn=1350-911X&rft.volume=52&rft.issue=4&rft.spage=289&rft.epage=291&rft_id=info:doi/10.1049%2Fel.2015.3706&rft.externalDBID=n%2Fa&rft.externalDocID=10_1049_el_2015_3706 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0013-5194&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0013-5194&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0013-5194&client=summon |