Calibration-less direct capacitor-to-microcontroller interface

A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor-to-microcontroller interface circuit that does not need a calibration capacitor is proposed. Basically, the measurement process consists of three consecutive steps of charge, discharge and charge of the capacit...

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Vydáno v:	Electronics letters Ročník 52; číslo 4; s. 289 - 291
Hlavní autoři:	Lopez-Lapeña, O, Serrano-Finetti, E, Casas, O
Médium:	Journal Article Publikace
Jazyk:	angličtina
Vydáno:	The Institution of Engineering and Technology 18.02.2016 Institution of Electrical Engineers
Témata:	Calibration calibrationless direct capacitor-to-microcontroller interface capacitance 33 nF to 4.7 nF capacitance 33 nF to 4.7 nF capacitance measurement capacitive sensor capacitive sensors capacitor charge capacitor discharge capacitor measurement Capacitors Charge Circuits cost reduction Detectors Deviation direct sensor-to-microcontroller interface circuit electron device testing Electronics Enginyeria electrònica Instrumentation and measurement Mathematical analysis measurement process Microcontroladors Microcontrollers nonlinear equation nonlinear equations reference value Sensors space reduction temperature 18 degC to 70 degC Àrees temàtiques de la UPC cost reduction capacitor charge capacitive sensors space reduction nonlinear equations capacitive sensor capacitors capacitance 33 nF to 4.7 nF direct sensor-to-microcontroller interface circuit measurement process reference value capacitor measurement electron device testing calibrationless direct capacitor-to-microcontroller interface capacitor discharge temperature 18 degC to 70 degC capacitance measurement nonlinear equation microcontrollers
ISSN:	0013-5194, 1350-911X, 1350-911X
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Popis
Shrnutí:	A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor-to-microcontroller interface circuit that does not need a calibration capacitor is proposed. Basically, the measurement process consists of three consecutive steps of charge, discharge and charge of the capacitor under test. A non-linear equation is obtained and solved that is dependent only on known circuit parameters. Experimental results show that it is possible to measure a wide range of capacitor values with a maximum deviation of 2% from the reference value, and that temperature changes from 18 to 70°C yield relative errors below 0.1%. For the lowest measured capacitor range (33 pF–4.7 nF) the uncertainty holds below 1 pF which enables measurement of commercially available capacitive sensors. The main advantage of the proposed technique is cost and space reduction of the final design.
Bibliografie:	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23
ISSN:	0013-5194 1350-911X 1350-911X
DOI:	10.1049/el.2015.3706