On the importance of FIB-SEM specific segmentation algorithms for porous media

A new algorithmic approach to segmentation of highly porous three dimensional image data gained by focused ion beam tomography is described which extends the key-principle of local threshold backpropagation described in Salzer et al. (2012). The technique of focused ion beam tomography has shown to...

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Vydáno v:	Materials characterization Ročník 95; s. 36 - 43
Hlavní autoři:	Salzer, Martin, Thiele, Simon, Zengerle, Roland, Schmidt, Volker
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York, NY Elsevier 01.09.2014
Témata:	ALGORITHMS CATHODES COMPARATIVE EVALUATIONS Cross-disciplinary physics: materials science; rheology ELECTROLYTES EPOXIDES Exact sciences and technology FUEL CELLS GAIN Imaging ION BEAMS MATERIALS SCIENCE MEMBRANES MICROSTRUCTURE NANOSCIENCE AND NANOTECHNOLOGY NANOSTRUCTURES Phase diagrams and microstructures developed by solidification and solid-solid phase transformations Physics POROUS MATERIALS RESINS SCANNING ELECTRON MICROSCOPY Segmentation Solidification Three dimensional THREE-DIMENSIONAL CALCULATIONS TOMOGRAPHY Porous media Scanning electron microscopy 3D Imaging Segmentation Imaging FIB-SEM tomography
ISSN:	1044-5803, 1873-4189
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Popis
Shrnutí:	A new algorithmic approach to segmentation of highly porous three dimensional image data gained by focused ion beam tomography is described which extends the key-principle of local threshold backpropagation described in Salzer et al. (2012). The technique of focused ion beam tomography has shown to be capable of imaging the microstructure of functional materials. In order to perform a quantitative analysis on the corresponding microstructure a segmentation task needs to be performed. However, algorithmic segmentation of images obtained with focused ion beam tomography is a challenging problem for highly porous materials if filling the pore phase, e.g. with epoxy resin, is difficult. The gray intensities of individual voxels are not sufficient to determine the phase represented by them and usual thresholding methods are not applicable. We thus propose a new approach to segmentation that pays respect to the specifics of the imaging process of focused ion beam tomography. As an application of our approach, the segmentation of three dimensional images for a cathode material used in polymer electrolyte membrane fuel cells is discussed. We show that our approach preserves significantly more of the original nanostructure than a thresholding approach.
Bibliografie:	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23
ISSN:	1044-5803 1873-4189
DOI:	10.1016/j.matchar.2014.05.014