On the importance of FIB-SEM specific segmentation algorithms for porous media

A new algorithmic approach to segmentation of highly porous three dimensional image data gained by focused ion beam tomography is described which extends the key-principle of local threshold backpropagation described in Salzer et al. (2012). The technique of focused ion beam tomography has shown to...

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Bibliographic Details
Published in:Materials characterization Vol. 95; pp. 36 - 43
Main Authors: Salzer, Martin, Thiele, Simon, Zengerle, Roland, Schmidt, Volker
Format: Journal Article
Language:English
Published: New York, NY Elsevier 01.09.2014
Subjects:
ALGORITHMS
CATHODES
COMPARATIVE EVALUATIONS
Cross-disciplinary physics: materials science; rheology
ELECTROLYTES
EPOXIDES
Exact sciences and technology
FUEL CELLS
GAIN
Imaging
ION BEAMS
MATERIALS SCIENCE
MEMBRANES
MICROSTRUCTURE
NANOSCIENCE AND NANOTECHNOLOGY
NANOSTRUCTURES
Phase diagrams and microstructures developed by solidification and solid-solid phase transformations
Physics
POROUS MATERIALS
RESINS
SCANNING ELECTRON MICROSCOPY
Segmentation
Solidification
Three dimensional
THREE-DIMENSIONAL CALCULATIONS
TOMOGRAPHY
Porous media
Scanning electron microscopy
3D Imaging
Segmentation
Imaging
FIB-SEM tomography
ISSN:1044-5803, 1873-4189
Online Access:Get full text
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Summary:A new algorithmic approach to segmentation of highly porous three dimensional image data gained by focused ion beam tomography is described which extends the key-principle of local threshold backpropagation described in Salzer et al. (2012). The technique of focused ion beam tomography has shown to be capable of imaging the microstructure of functional materials. In order to perform a quantitative analysis on the corresponding microstructure a segmentation task needs to be performed. However, algorithmic segmentation of images obtained with focused ion beam tomography is a challenging problem for highly porous materials if filling the pore phase, e.g. with epoxy resin, is difficult. The gray intensities of individual voxels are not sufficient to determine the phase represented by them and usual thresholding methods are not applicable. We thus propose a new approach to segmentation that pays respect to the specifics of the imaging process of focused ion beam tomography. As an application of our approach, the segmentation of three dimensional images for a cathode material used in polymer electrolyte membrane fuel cells is discussed. We show that our approach preserves significantly more of the original nanostructure than a thresholding approach.
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ISSN:1044-5803
1873-4189
DOI:10.1016/j.matchar.2014.05.014