On the importance of FIB-SEM specific segmentation algorithms for porous media

A new algorithmic approach to segmentation of highly porous three dimensional image data gained by focused ion beam tomography is described which extends the key-principle of local threshold backpropagation described in Salzer et al. (2012). The technique of focused ion beam tomography has shown to...

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Bibliographic Details
Published in:	Materials characterization Vol. 95; pp. 36 - 43
Main Authors:	Salzer, Martin, Thiele, Simon, Zengerle, Roland, Schmidt, Volker
Format:	Journal Article
Language:	English
Published:	New York, NY Elsevier 01.09.2014
Subjects:	ALGORITHMS CATHODES COMPARATIVE EVALUATIONS Cross-disciplinary physics: materials science; rheology ELECTROLYTES EPOXIDES Exact sciences and technology FUEL CELLS GAIN Imaging ION BEAMS MATERIALS SCIENCE MEMBRANES MICROSTRUCTURE NANOSCIENCE AND NANOTECHNOLOGY NANOSTRUCTURES Phase diagrams and microstructures developed by solidification and solid-solid phase transformations Physics POROUS MATERIALS RESINS SCANNING ELECTRON MICROSCOPY Segmentation Solidification Three dimensional THREE-DIMENSIONAL CALCULATIONS TOMOGRAPHY Porous media Scanning electron microscopy 3D Imaging Segmentation Imaging FIB-SEM tomography
ISSN:	1044-5803, 1873-4189
Online Access:	Get full text
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