Fault-Tolerant Thresholds for the Surface Code in Excess of 5 % Under Biased Noise

Noise in quantum computing is countered with quantum error correction. Achieving optimal performance will require tailoring codes and decoding algorithms to account for features of realistic noise, such as the common situation where the noise is biased towards dephasing. Here we introduce an efficie...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physical review letters Jg. 124; H. 13; S. 130501
Hauptverfasser: Tuckett, David K., Bartlett, Stephen D., Flammia, Steven T., Brown, Benjamin J.
Format: Journal Article
Sprache:Englisch
Veröffentlicht: United States American Physical Society 03.04.2020
Schlagworte:
Algorithms
Decoding
Error correction
Fault tolerance
Minimum weight
Noise threshold
Quantum computing
Thresholds
ISSN:0031-9007, 1079-7114, 1079-7114
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Noise in quantum computing is countered with quantum error correction. Achieving optimal performance will require tailoring codes and decoding algorithms to account for features of realistic noise, such as the common situation where the noise is biased towards dephasing. Here we introduce an efficient high-threshold decoder for a noise-tailored surface code based on minimum-weight perfect matching. The decoder exploits the symmetries of its syndrome under the action of biased noise and generalizes to the fault-tolerant regime where measurements are unreliable. Using this decoder, we obtain fault-tolerant thresholds in excess of 6% for a phenomenological noise model in the limit where dephasing dominates. These gains persist even for modest noise biases: we find a threshold of ∼5% in an experimentally relevant regime where dephasing errors occur at a rate 100 times greater than bit-flip errors.
Bibliographie:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
content type line 23
ISSN:0031-9007
1079-7114
1079-7114
DOI:10.1103/PhysRevLett.124.130501