The impact of software enhancement on software reliability

This paper exploits the 'relationship between functional-enhancement (FE) activity and the distribution of software defects' to develop a discriminant model that identifies high-risk program modules, 'FE activity' and 'defect data captured during the FE of a commercial progr...

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Vydané v:IEEE transactions on reliability Ročník 44; číslo 4; s. 677 - 682
Hlavní autori: Lanning, D.L., Khoshgoftaar, T.M.
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: New York, NY IEEE 01.12.1995
Institute of Electrical and Electronics Engineers
Predmet:
Applied sciences
Computer science; control theory; systems
Computer systems performance. Reliability
Exact sciences and technology
Iron
Marine vehicles
Predictive models
Programming
Scheduling
Software
Software engineering
Software measurement
Software quality
Software reliability
Software testing
System testing
High risk
Improvement
Discriminant analysis
Software development
Vocational aptitude
Software reliability
Modeling
Occupational training
Defect detection
Software engineering
ISSN:0018-9529
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Shrnutí:This paper exploits the 'relationship between functional-enhancement (FE) activity and the distribution of software defects' to develop a discriminant model that identifies high-risk program modules, 'FE activity' and 'defect data captured during the FE of a commercial programming language processing utility' serve to fit and test the predictive quality of this model. The model misclassification rates demonstrate that FE information is sufficient for developing discriminant models identifying high-risk program modules. Consideration of the misclassified functions leads us to suggest that: (1) the level of routines in the calling hierarchy introduces variation in defect distribution; and (2) the impact of a defect indicates the risk that it presents. Thus consideration of defect impact can improve the discriminant results.
Bibliografia:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9529
DOI:10.1109/24.476001