A surface defect identification method based on improved threshold segmentation algorithm

For enterprises, defect detection is very important because it is related to the quality of products produced by enterprises. With the development of machine vision, accurate analysis of image data benefits defect detection. In an enterprise that produces electronic cigarettes, professional and tech...

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Veröffentlicht in:	Journal of physics. Conference series Jg. 1651; H. 1; S. 12072 - 12076
Hauptverfasser:	Feng, Xinglong, Gao, Xianwen, Luo, Ling
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	Bristol IOP Publishing 01.11.2020
Schlagworte:	Algorithms Identification methods Image segmentation Machine vision Physics Surface defects Workpieces
ISSN:	1742-6588, 1742-6596
Online-Zugang:	Volltext
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