Non-piezoelectric effects in piezoresponse force microscopy

Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantil...

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Vydané v:	Current applied physics Ročník 17; číslo 5; s. 661 - 674
Hlavní autori:	Seol, Daehee, Kim, Bora, Kim, Yunseok
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Elsevier B.V 01.05.2017 한국물리학회
Predmet:	Electrochemical strain Electromechanical response Electrostatic effect Piezoelectric effect Piezoresponse force microscopy 물리학 Electromechanical response Electrostatic effect Electrochemical strain Piezoresponse force microscopy Piezoelectric effect
ISSN:	1567-1739, 1878-1675
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Abstract	Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a fundamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses.
AbstractList	Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a fundamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses. Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a fundamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses. KCI Citation Count: 31
Author	Kim, Bora Kim, Yunseok Seol, Daehee
Author_xml	– sequence: 1 givenname: Daehee surname: Seol fullname: Seol, Daehee – sequence: 2 givenname: Bora surname: Kim fullname: Kim, Bora – sequence: 3 givenname: Yunseok surname: Kim fullname: Kim, Yunseok email: yunseokkim@skku.edu
BackLink	https://www.kci.go.kr/kciportal/ci/sereArticleSearch/ciSereArtiView.kci?sereArticleSearchBean.artiId=ART002216611$$DAccess content in National Research Foundation of Korea (NRF)
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Snippet	Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging...
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SubjectTerms	Electrochemical strain Electromechanical response Electrostatic effect Piezoelectric effect Piezoresponse force microscopy 물리학
Title	Non-piezoelectric effects in piezoresponse force microscopy
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