Self-Testing of Analog Parts Terminated by ADCs Based on Multiple Sampling of Time Responses

A new approach for self-testing of analog parts terminated by analog-to-digital converters in mixed-signal electronic microsystems controlled by microcontrollers is presented. It is based upon a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a...

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Veröffentlicht in:IEEE transactions on instrumentation and measurement Jg. 62; H. 12; S. 3160 - 3167
1. Verfasser: Czaja, Zbigniew
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York IEEE 01.12.2013
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Schlagworte:
Algorithms
Analog circuits
Built-in self-test
Electronics
Fault detection
Fault diagnosis
Faults
Fourier transforms
Instrumentation
Localization
Microcontrollers
Position (location)
Sampling
self-testing
ISSN:0018-9456, 1557-9662
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Zusammenfassung:A new approach for self-testing of analog parts terminated by analog-to-digital converters in mixed-signal electronic microsystems controlled by microcontrollers is presented. It is based upon a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into localization curves placed in a multidimensional measurement space. The method can be used for fault detection and single soft fault localization. Modified digital Fourier transform formulas are used for conversion of the measurement results to the form used by the fault detection and localization algorithm during the self-testing of the system and also for creation of the fault dictionary. In this paper, the results of experimental verification of the approach are included.
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ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2013.2272867