Huang, C., Blondheim, D., & Zhou, S. (2025). A comparison study on anomaly detection methods in manufacturing process monitoring with X-ray images. Journal of intelligent manufacturing, 36(6), 4389-4409. https://doi.org/10.1007/s10845-024-02435-x
Chicago Style (17th ed.) CitationHuang, Congfang, David Blondheim, and Shiyu Zhou. "A Comparison Study on Anomaly Detection Methods in Manufacturing Process Monitoring with X-ray Images." Journal of Intelligent Manufacturing 36, no. 6 (2025): 4389-4409. https://doi.org/10.1007/s10845-024-02435-x.
MLA (9th ed.) CitationHuang, Congfang, et al. "A Comparison Study on Anomaly Detection Methods in Manufacturing Process Monitoring with X-ray Images." Journal of Intelligent Manufacturing, vol. 36, no. 6, 2025, pp. 4389-4409, https://doi.org/10.1007/s10845-024-02435-x.