Microstructure analysis of NiO nanocrystals and enhanced photocatalytic activities of NiO-CdS nanocomposites

A comprehensive study on the microstructure of chemically prepared NiO nanocrystals has been carried out using various forms of Williamson–Hall (WH) formulation of X-ray diffraction (XRD) line profile analysis viz. uniform deformation model (UDM), uniform stress deformation model (USDM), uniform def...

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Vydané v:	Journal of materials science. Materials in electronics Ročník 33; číslo 10; s. 7824 - 7837
Hlavní autori:	Sharma, Saurabh K., Kalita, Manos P. C.
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	New York Springer US 01.04.2022 Springer Nature B.V
Predmet:	Characterization and Evaluation of Materials Chemistry and Materials Science Crystal defects Crystallites Deformation Dislocation density Dyes Flux density Heterojunctions Interstitial defects Lattice strain Lattice vacancies Light irradiation Materials Science Methylene blue Microstructure Nanocomposites Nanocrystals Nickel oxides Optical and Electronic Materials Optical properties Photocatalysis
ISSN:	0957-4522, 1573-482X
On-line prístup:	Získať plný text
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