Microstructure analysis of NiO nanocrystals and enhanced photocatalytic activities of NiO-CdS nanocomposites
A comprehensive study on the microstructure of chemically prepared NiO nanocrystals has been carried out using various forms of Williamson–Hall (WH) formulation of X-ray diffraction (XRD) line profile analysis viz. uniform deformation model (UDM), uniform stress deformation model (USDM), uniform def...
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| Published in: | Journal of materials science. Materials in electronics Vol. 33; no. 10; pp. 7824 - 7837 |
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| Main Authors: | , |
| Format: | Journal Article |
| Language: | English |
| Published: |
New York
Springer US
01.04.2022
Springer Nature B.V |
| Subjects: | |
| ISSN: | 0957-4522, 1573-482X |
| Online Access: | Get full text |
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