Microstructure analysis of NiO nanocrystals and enhanced photocatalytic activities of NiO-CdS nanocomposites

A comprehensive study on the microstructure of chemically prepared NiO nanocrystals has been carried out using various forms of Williamson–Hall (WH) formulation of X-ray diffraction (XRD) line profile analysis viz. uniform deformation model (UDM), uniform stress deformation model (USDM), uniform def...

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Bibliographic Details
Published in:Journal of materials science. Materials in electronics Vol. 33; no. 10; pp. 7824 - 7837
Main Authors: Sharma, Saurabh K., Kalita, Manos P. C.
Format: Journal Article
Language:English
Published: New York Springer US 01.04.2022
Springer Nature B.V
Subjects:
ISSN:0957-4522, 1573-482X
Online Access:Get full text
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