Microstructure analysis of NiO nanocrystals and enhanced photocatalytic activities of NiO-CdS nanocomposites

A comprehensive study on the microstructure of chemically prepared NiO nanocrystals has been carried out using various forms of Williamson–Hall (WH) formulation of X-ray diffraction (XRD) line profile analysis viz. uniform deformation model (UDM), uniform stress deformation model (USDM), uniform def...

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Veröffentlicht in:	Journal of materials science. Materials in electronics Jg. 33; H. 10; S. 7824 - 7837
Hauptverfasser:	Sharma, Saurabh K., Kalita, Manos P. C.
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	New York Springer US 01.04.2022 Springer Nature B.V
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Crystal defects Crystallites Deformation Dislocation density Dyes Flux density Heterojunctions Interstitial defects Lattice strain Lattice vacancies Light irradiation Materials Science Methylene blue Microstructure Nanocomposites Nanocrystals Nickel oxides Optical and Electronic Materials Optical properties Photocatalysis
ISSN:	0957-4522, 1573-482X
Online-Zugang:	Volltext
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