LDPC Coding Scheme for Improving the Reliability of Multi-Level-Cell NAND Flash Memory in Radiation Environments

Utilizing commercial off-the-shelf（COTS） components in satellites has received much attention due to the low cost. However, commercial memories suffer severe reliability problems in radiation environments. This paper studies the low-density parity-check（LDPC） coding scheme for improving the reliabil...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:China communications Ročník 14; číslo 8; s. 10 - 21
Hlavní autoři: Ge, Guangjun, Yin, Liuguo
Médium: Journal Article
Jazyk:angličtina
Vydáno: China Institute of Communications 01.08.2017
School of Aerospace, Tsinghua University, Beijing 100084, China
EDA Laboratory, Research Institute of Tsinghua University in Shenzhen, Shenzhen 518057, China
Témata:
commercial off-the-shelf (COTS) components
Flash memories
joint detection-decoding
LDPC码
low-density parity-check (LDPC) coding
multi-level-cell (MLC) NAND Flash memory
NAND闪存
Optimization
Parity check codes
Reliability
Resource management
space radiation environments
Threshold voltage
Writing
低密度奇偶校验
可靠性问题
多级单元
快闪存储器
编码方案
辐射环境
low-density parity-check (LDPC) coding
multi-level-cell (MLC) NAND Flash memory
space radiation environments
joint detection-decoding
commercial off-the-shelf (COTS) components
ISSN:1673-5447
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:Utilizing commercial off-the-shelf（COTS） components in satellites has received much attention due to the low cost. However, commercial memories suffer severe reliability problems in radiation environments. This paper studies the low-density parity-check（LDPC） coding scheme for improving the reliability of multi-level-cell（MLC） NAND Flash memory in radiation environments. Firstly, based on existing physical experiment works, we introduce a new error model for heavyion irradiations; secondly, we explore the optimization of writing voltage allocation to maximize the capacity of the storage channel; thirdly, we design the degree distribution of LDPC codes that is specially suitable for the proposed model; finally, we propose a joint detection-decoding scheme based on LDPC codes, which estimates the storage channel state and executes an adaptive log-likelihood ratio（LLR） calculation to achieve better performance. Simulation results show that, compared with the conventional LDPC coding scheme, the proposed scheme may almost double the lifetime of the MLC NAND Flash memory in radiation environments.
Bibliografie:low-density parity-check（LDPC） coding multi-level-cell（MLC） NAND Flash memory joint detection-decoding commercial off-the-shelf（COTS） components space radiation environments
Utilizing commercial off-the-shelf（COTS） components in satellites has received much attention due to the low cost. However, commercial memories suffer severe reliability problems in radiation environments. This paper studies the low-density parity-check（LDPC） coding scheme for improving the reliability of multi-level-cell（MLC） NAND Flash memory in radiation environments. Firstly, based on existing physical experiment works, we introduce a new error model for heavyion irradiations; secondly, we explore the optimization of writing voltage allocation to maximize the capacity of the storage channel; thirdly, we design the degree distribution of LDPC codes that is specially suitable for the proposed model; finally, we propose a joint detection-decoding scheme based on LDPC codes, which estimates the storage channel state and executes an adaptive log-likelihood ratio（LLR） calculation to achieve better performance. Simulation results show that, compared with the conventional LDPC coding scheme, the proposed scheme may almost double the lifetime of the MLC NAND Flash memory in radiation environments.
11-5439/TN
ISSN:1673-5447
DOI:10.1109/CC.2017.8014343