Optimization of double layered graphene-based microwave absorber in X-band using Pareto genetic algorithm

Thin multi-layered microwave absorbing structure design and development is a cutting edge technology for researchers. The present work has been attentively focused on the development of efficient multilayered microwave absorbing structure pertained to X-band (8.2 GHz to12.4 GHz). Graphene/epoxy nano...

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Bibliographic Details
Published in:Materials Research Express Vol. 6; no. 10; pp. 105610 - 105619
Main Authors: Santhosi, B V S R N, Ramji, K, Rao, N B R Mohan
Format: Journal Article
Language:English
Published: IOP Publishing 21.08.2019
Subjects:
graphene
microwave absorption
nanocomposite
pareto genetic algorithm
ISSN:2053-1591, 2053-1591
Online Access:Get full text
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Summary:Thin multi-layered microwave absorbing structure design and development is a cutting edge technology for researchers. The present work has been attentively focused on the development of efficient multilayered microwave absorbing structure pertained to X-band (8.2 GHz to12.4 GHz). Graphene/epoxy nanocomposite material has been proposed with various weight percentages to predict the optimum multilayered structure for the microwave absorption application. The complete characterization of graphene has been done experimentally through x-ray diffraction (XRD), Fourier-transform infrared spectroscopy (FTIR), Raman Spectroscopy and field emission scanning electron microscope (FESEM). Further, the electromagnetic properties of different nanocomposites are measured using waveguide experiment technique and later reflection loss (RL) empirical calculation is done. The optimum number of layers for microwave absorber is envisaged using a genetic algorithm (GA) in addition to the total thickness of the multilayered structure. Moreover, the predicted optimum multilayered RL is compared with experimental results and it is found that excellent agreement exists between them. It is concluded that the non-dominated sorting genetic algorithm-II (NSGA-II) is best suitable for the prediction of a number of layers and total thickness for multilayered structures which is an emerging technology for microwave absorption application.
Bibliography:MRX-113875.R1
ISSN:2053-1591
2053-1591
DOI:10.1088/2053-1591/ab398f