Digital twin application for attach detection and mitigation of PV-based smart systems using fast and accurate hybrid machine learning algorithm
•An analysis of the system's effectiveness and the attacks' impacts from both a financial and social standpoint has been presented.•Wald's Sequential hypothesis testing (SHT) process is used to propose a straightforward approach for detecting DIA.•SHTs are widely used in the manufactu...
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| Published in: | Solar energy Vol. 250; pp. 377 - 387 |
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| Main Authors: | , , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
Elsevier Ltd
15.01.2023
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| Subjects: | |
| ISSN: | 0038-092X, 1471-1257 |
| Online Access: | Get full text |
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| Summary: | •An analysis of the system's effectiveness and the attacks' impacts from both a financial and social standpoint has been presented.•Wald's Sequential hypothesis testing (SHT) process is used to propose a straightforward approach for detecting DIA.•SHTs are widely used in the manufacturing sector to detect defective parts.
Microgrids (MG) is originally designed to make Smart Grids more energy-efficient and reliable. The MG represents a complex cyber-physical system whose functioning is driven by the interaction of physical actions and computational elements, making it vulnerable to many forms of malicious cyber-attack. This study considers the effect of data integrity attack (DIA) on the performance of hybrid MGs, an important cyber threat to microgrids (MGs). Further, this paper develops a new process using sequential hypothesis testing (SHT) for detecting DIA on renewable energy resources and improving the security of information in hybrid MGs. By using a binary sample generated from the suggested approach, an analysis statistic is computed and afterward compared to 2 thresholds for deciding between the 3 options. On the measured energy production of renewable energy sources such as wind turbines, DIAs of various severity levels have been conducted for assessing the impact of DIAs on hybrid MG security. A standard IEEE test system has been used to evaluate the efficiency of the suggested process. |
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| ISSN: | 0038-092X 1471-1257 |
| DOI: | 10.1016/j.solener.2023.01.007 |