Design of self-testable wafer-scale processor arrays

A technique for designing self-testable wafer-scale arrays is presented. Faulty and Fault-free cells (processors, PEs) are indentified in distributed fashion without providing correct responses from the outside. It uses both local comparisons and dissemination of the comparison results. Faults in di...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:International journal of electronics Ročník 69; číslo 5; s. 665 - 671
Hlavní autor: CHOI, YOON-HWA
Médium: Journal Article
Jazyk:angličtina
Vydáno: London Taylor & Francis Group 01.11.1990
Taylor & Francis
Témata:
Applied sciences
Electronics
Exact sciences and technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Processor
Circuit design
Test
Network
Defect
Algorithm
Wafer
ISSN:0020-7217, 1362-3060
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:A technique for designing self-testable wafer-scale arrays is presented. Faulty and Fault-free cells (processors, PEs) are indentified in distributed fashion without providing correct responses from the outside. It uses both local comparisons and dissemination of the comparison results. Faults in diagnostic circuits, which have been typically assumed to be fault-free, are also covered by the self-testing algorithm. The algorithm is quite general in the sense that it is independent of the structure of the syndrome analyser in each cell.
Bibliografie:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0020-7217
1362-3060
DOI:10.1080/00207219008920353