APA (7th ed.) Citation

CHOI, Y. (1990). Design of self-testable wafer-scale processor arrays. International journal of electronics, 69(5), 665-671. https://doi.org/10.1080/00207219008920353

Chicago Style (17th ed.) Citation

CHOI, YOON-HWA. "Design of Self-testable Wafer-scale Processor Arrays." International Journal of Electronics 69, no. 5 (1990): 665-671. https://doi.org/10.1080/00207219008920353.

MLA (9th ed.) Citation

CHOI, YOON-HWA. "Design of Self-testable Wafer-scale Processor Arrays." International Journal of Electronics, vol. 69, no. 5, 1990, pp. 665-671, https://doi.org/10.1080/00207219008920353.