Autoencoder-aided measurement of concentration from a single line of speckle

We demonstrate that a single 6mm line sample of simulated near-field speckle intensity suffices for accurate estimation of the concentration of dielectric micro-particles over a range from 104 to 6⋅106 particles per ml. For this estimation, we analyze the speckle using both standard methods (linear...

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Veröffentlicht in:Optics express Jg. 27; H. 20; S. 29098
Hauptverfasser: Karamehmedović, Mirza, Šehić, Kenan, Dammann, Bernd, Suljagić, Mirza, Karamehmedović, Emir
Format: Journal Article
Sprache:Englisch
Veröffentlicht: 30.09.2019
ISSN:1094-4087, 1094-4087
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Zusammenfassung:We demonstrate that a single 6mm line sample of simulated near-field speckle intensity suffices for accurate estimation of the concentration of dielectric micro-particles over a range from 104 to 6⋅106 particles per ml. For this estimation, we analyze the speckle using both standard methods (linear principal component analysis, support vector machine (SVM)) and a neural network, in the form of a sparse stacked autoencoder (SSAE) with a softmax classifier or with an SVM. Using an SSAE with SVM, we classify line speckle samples according to particle concentration with an average accuracy of over 78%, with other methods close behind.We demonstrate that a single 6mm line sample of simulated near-field speckle intensity suffices for accurate estimation of the concentration of dielectric micro-particles over a range from 104 to 6⋅106 particles per ml. For this estimation, we analyze the speckle using both standard methods (linear principal component analysis, support vector machine (SVM)) and a neural network, in the form of a sparse stacked autoencoder (SSAE) with a softmax classifier or with an SVM. Using an SSAE with SVM, we classify line speckle samples according to particle concentration with an average accuracy of over 78%, with other methods close behind.
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.27.029098