Efficient distributed algorithms for self testing of multiple processor systems

Multiple processor systems allow both highly reliable and highly fast service. Distributed self-test algorithms that attempt to improve both the reliability and the performance of these systems are proposed. In these algorithms, reliability is improved by considering the distributed mode of control...

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Veröffentlicht in:	IEEE transactions on computers Jg. 41; H. 11; S. 1397 - 1409
Hauptverfasser:	Hosseini, S.H., Jamal, N.
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	New York, NY IEEE 01.11.1992 Institute of Electrical and Electronics Engineers
Schlagworte:	Applied sciences Automatic testing Built-in self-test Communication channels Computer science; control theory; systems Computer systems and distributed systems. User interface Distributed algorithms Distributed computing Distributed control Exact sciences and technology Fault diagnosis Performance evaluation Process control Software System testing Multiprocessor Fault tolerance Test Spanning tree Computer system Distributed system System reliability Synchronization Time complexity Fault diagnostic Non directed graph Reconfiguration
ISSN:	0018-9340
Online-Zugang:	Volltext
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