Efficient distributed algorithms for self testing of multiple processor systems

Multiple processor systems allow both highly reliable and highly fast service. Distributed self-test algorithms that attempt to improve both the reliability and the performance of these systems are proposed. In these algorithms, reliability is improved by considering the distributed mode of control...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:IEEE transactions on computers Ročník 41; číslo 11; s. 1397 - 1409
Hlavní autoři: Hosseini, S.H., Jamal, N.
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York, NY IEEE 01.11.1992
Institute of Electrical and Electronics Engineers
Témata:
ISSN:0018-9340
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Abstract Multiple processor systems allow both highly reliable and highly fast service. Distributed self-test algorithms that attempt to improve both the reliability and the performance of these systems are proposed. In these algorithms, reliability is improved by considering the distributed mode of control and assigning processors to test each other periodically for the diagnosis and isolation of the faulty processors and interprocessor links. Meanwhile, performance is improved by considering a dynamic testing strategy and minimizing testing overhead by reducing the number of tests performed on each processor. Simulation results show the effectiveness of the algorithms.< >
AbstractList Multiple processor systems allow both highly reliable and highly fast service. Distributed self-test algorithms that attempt to improve both the reliability and the performance of these systems are proposed. In these algorithms, reliability is improved by considering the distributed mode of control and assigning processors to test each other periodically for the diagnosis and isolation of the faulty processors and interprocessor links. Meanwhile, performance is improved by considering a dynamic testing strategy and minimizing testing overhead by reducing the number of tests performed on each processor. Simulation results show the effectiveness of the algorithms
Multiple processor systems allow both highly reliable and highly fast service. Distributed self-test algorithms that attempt to improve both the reliability and the performance of these systems are proposed. In these algorithms, reliability is improved by considering the distributed mode of control and assigning processors to test each other periodically for the diagnosis and isolation of the faulty processors and interprocessor links. Meanwhile, performance is improved by considering a dynamic testing strategy and minimizing testing overhead by reducing the number of tests performed on each processor. Simulation results show the effectiveness of the algorithms.< >
Author Hosseini, S.H.
Jamal, N.
Author_xml – sequence: 1
  givenname: S.H.
  surname: Hosseini
  fullname: Hosseini, S.H.
  organization: Dept. of Electr. Eng. & Comput. Sci., Wisconsin Univ., Milwaukee, WI, USA
– sequence: 2
  givenname: N.
  surname: Jamal
  fullname: Jamal, N.
  organization: Dept. of Electr. Eng. & Comput. Sci., Wisconsin Univ., Milwaukee, WI, USA
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=4518526$$DView record in Pascal Francis
BookMark eNpt0D1PwzAQBmAPRaItDKxMGRASQ1vbSV17RFX5kCp1gTlynHMxcuLic4b-e1KlAgkx3XDPnV69EzJqQwuE3DA6Z4yqBeNztlrljI7ImFImZyov6CWZIH5SSgWnakx2G2udcdCmrHaYoqu6BHWm_T5Elz4azGyIGYK3WQJMrt1nwWZN55M7eMgOMRhAPJEjJmjwilxY7RGuz3NK3p82b-uX2Xb3_Lp-3M5MTkWa5cIIIQvGFa-0ZDVnoqi4MUqBKDTIQllRm0JKaankRQ1WSsVrzq2qhFnZfEruh799gq-uT1Y2Dg14r1sIHZZccilEnvfw7gw1Gu1t1K1xWB6ia3Q8lsWSySUXPXsYmIkBMYL9EYyWpzZLxsuhzd4u_ljjkk4utClq5_-9uB0uHAD8fh6W352wgxE
CODEN ITCOB4
CitedBy_id crossref_primary_10_1016_S0164_1212_01_00134_0
crossref_primary_10_1016_0165_6074_93_90069_W
crossref_primary_10_1016_S0167_8191_97_00023_9
crossref_primary_10_1016_S0167_8191_98_00048_9
Cites_doi 10.1109/TCOM.1983.1095883
10.1109/MSPEC.1987.6447968
10.1109/TC.1985.1676512
10.1145/357195.357200
10.1109/MC.1986.1663180
10.1145/2993.2994
10.1038/scientificamerican0687-108
10.1109/12.2158
10.1109/TC.1984.1676419
10.1109/PGEC.1967.264748
10.1109/12.30846
10.1145/800053.801905
10.1109/TC.1984.1676437
10.1109/TC.1982.1676101
10.1109/SPDP.1990.143535
10.1145/28395.28421
10.1145/2465.2467
10.1109/12.21122
10.1109/2.73
10.1109/ICDCS.1991.148707
10.1145/2455.2457
10.1109/FTCSH.1995.532651
10.1016/0020-0190(86)90043-8
10.1109/PCCC.1989.37438
10.1109/TC.1987.5009481
ContentType Journal Article
Copyright 1993 INIST-CNRS
Copyright_xml – notice: 1993 INIST-CNRS
DBID AAYXX
CITATION
IQODW
7SC
8FD
JQ2
L7M
L~C
L~D
DOI 10.1109/12.177310
DatabaseName CrossRef
Pascal-Francis
Computer and Information Systems Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle CrossRef
Computer and Information Systems Abstracts
Technology Research Database
Computer and Information Systems Abstracts – Academic
Advanced Technologies Database with Aerospace
ProQuest Computer Science Collection
Computer and Information Systems Abstracts Professional
DatabaseTitleList Computer and Information Systems Abstracts

DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Computer Science
Applied Sciences
EndPage 1409
ExternalDocumentID 4518526
10_1109_12_177310
177310
GroupedDBID --Z
-DZ
-~X
.55
.DC
0R~
29I
3EH
3O-
4.4
5GY
5VS
6IK
85S
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABFSI
ABQJQ
ABVLG
ACGFO
ACIWK
ACNCT
AENEX
AETEA
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
E.L
EBS
EJD
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IEDLZ
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
MVM
O9-
OCL
P2P
PQQKQ
RIA
RIE
RNI
RNS
RXW
RZB
TAE
TN5
TWZ
UHB
UKR
UPT
VH1
X7M
XJT
XOL
XZL
YXB
YYQ
YZZ
ZCG
AAYXX
ABUFD
CITATION
AAYOK
IQODW
RIG
7SC
8FD
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-c306t-36c66841292ba81d2164b2cc99e64ae849f6dc4888f0824def8892d22f9b6c7f3
IEDL.DBID RIE
ISICitedReferencesCount 7
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=10_1109_12_177310&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 0018-9340
IngestDate Thu Oct 02 06:29:13 EDT 2025
Wed Apr 02 07:18:29 EDT 2025
Sat Nov 29 03:57:01 EST 2025
Tue Nov 18 21:43:28 EST 2025
Wed Aug 27 02:49:05 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 11
Keywords Multiprocessor
Fault tolerance
Test
Spanning tree
Computer system
Distributed system
System reliability
Synchronization
Time complexity
Fault diagnostic
Non directed graph
Reconfiguration
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
CC BY 4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c306t-36c66841292ba81d2164b2cc99e64ae849f6dc4888f0824def8892d22f9b6c7f3
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
PQID 28286633
PQPubID 23500
PageCount 13
ParticipantIDs crossref_primary_10_1109_12_177310
ieee_primary_177310
pascalfrancis_primary_4518526
proquest_miscellaneous_28286633
crossref_citationtrail_10_1109_12_177310
PublicationCentury 1900
PublicationDate 1992-11-01
PublicationDateYYYYMMDD 1992-11-01
PublicationDate_xml – month: 11
  year: 1992
  text: 1992-11-01
  day: 01
PublicationDecade 1990
PublicationPlace New York, NY
PublicationPlace_xml – name: New York, NY
PublicationTitle IEEE transactions on computers
PublicationTitleAbbrev TC
PublicationYear 1992
Publisher IEEE
Institute of Electrical and Electronics Engineers
Publisher_xml – name: IEEE
– name: Institute of Electrical and Electronics Engineers
References ref13
ref34
ref12
ref15
ref14
ref31
ref30
ref11
liaw (ref19) 1982
ref32
ref10
ref2
ref1
ref17
(ref24) 1986
hosseini (ref36) 1983
ref16
ref18
merlin (ref35) 1978
(ref4) 1989
(ref25) 1988
ref26
ref20
berge (ref33) 1973
ref22
ref21
ciompi (ref7) 1981
(ref23) 1987
ref28
ref27
ref29
seitz (ref5) 1985; 28
ref8
(ref3) 1988
ref9
ref6
References_xml – start-page: 56
  year: 1983
  ident: ref36
  article-title: On integrated fault-diagnosis and error recovery in distributed computing systems
  publication-title: Proc FTCS-22 Int Symp Fault-Tolerant Computing
– ident: ref29
  doi: 10.1109/TCOM.1983.1095883
– ident: ref26
  doi: 10.1109/MSPEC.1987.6447968
– ident: ref8
  doi: 10.1109/TC.1985.1676512
– ident: ref28
  doi: 10.1145/357195.357200
– ident: ref18
  doi: 10.1109/MC.1986.1663180
– ident: ref31
  doi: 10.1145/2993.2994
– year: 1986
  ident: ref24
  publication-title: Reliability Handbook
– year: 1988
  ident: ref25
  publication-title: Systems Quality/Reliability Handbook
– ident: ref2
  doi: 10.1038/scientificamerican0687-108
– ident: ref13
  doi: 10.1109/12.2158
– year: 1973
  ident: ref33
  publication-title: Graphs and Hypergraphs
– start-page: 129
  year: 1978
  ident: ref35
  article-title: State restoration in distributed systems
  publication-title: FTCS-8 Proc 8th Annu Int Conf Fault-Tolerant Comput
– ident: ref15
  doi: 10.1109/TC.1984.1676419
– ident: ref6
  doi: 10.1109/PGEC.1967.264748
– ident: ref9
  doi: 10.1109/12.30846
– ident: ref16
  doi: 10.1145/800053.801905
– year: 1981
  ident: ref7
  article-title: Distributed diagnosis in multiprocessor systems: The MYTEAM approach
  publication-title: ?roc 13th IEEE Int Symp on Fault-Tolerant Computing
– ident: ref1
  doi: 10.1109/TC.1984.1676437
– ident: ref22
  doi: 10.1109/TC.1982.1676101
– ident: ref12
  doi: 10.1109/SPDP.1990.143535
– ident: ref27
  doi: 10.1145/28395.28421
– volume: 28
  start-page: 22
  year: 1985
  ident: ref5
  article-title: The cosmic cube
  publication-title: Commun ACM
  doi: 10.1145/2465.2467
– ident: ref21
  doi: 10.1109/12.21122
– ident: ref34
  doi: 10.1109/2.73
– year: 1989
  ident: ref4
  publication-title: NCUBE Data Book
– year: 1987
  ident: ref23
  publication-title: Quality and Reliability Handbook
– ident: ref20
  doi: 10.1109/12.21122
– year: 1988
  ident: ref3
  publication-title: IPSC Data Book
– ident: ref11
  doi: 10.1109/ICDCS.1991.148707
– start-page: 349
  year: 1982
  ident: ref19
  article-title: Self diagnosis of nonhomogeneous distributed systems
  publication-title: Proc 12th Int Symp Fault-Tolerant Comput
– ident: ref32
  doi: 10.1145/2455.2457
– ident: ref17
  doi: 10.1109/FTCSH.1995.532651
– ident: ref30
  doi: 10.1016/0020-0190(86)90043-8
– ident: ref10
  doi: 10.1109/PCCC.1989.37438
– ident: ref14
  doi: 10.1109/TC.1987.5009481
SSID ssj0006209
Score 1.433069
Snippet Multiple processor systems allow both highly reliable and highly fast service. Distributed self-test algorithms that attempt to improve both the reliability...
SourceID proquest
pascalfrancis
crossref
ieee
SourceType Aggregation Database
Index Database
Enrichment Source
Publisher
StartPage 1397
SubjectTerms Applied sciences
Automatic testing
Built-in self-test
Communication channels
Computer science; control theory; systems
Computer systems and distributed systems. User interface
Distributed algorithms
Distributed computing
Distributed control
Exact sciences and technology
Fault diagnosis
Performance evaluation
Process control
Software
System testing
Title Efficient distributed algorithms for self testing of multiple processor systems
URI https://ieeexplore.ieee.org/document/177310
https://www.proquest.com/docview/28286633
Volume 41
WOSCitedRecordID wos10_1109_12_177310&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE/IET Electronic Library (IEL) (UW System Shared)
  issn: 0018-9340
  databaseCode: RIE
  dateStart: 19680101
  customDbUrl:
  isFulltext: true
  dateEnd: 99991231
  titleUrlDefault: https://ieeexplore.ieee.org/
  omitProxy: false
  ssIdentifier: ssj0006209
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT8MwDI4AcYADjwFiPCPEgUthTdO0OSK0iRNwAIlblSUOII12Wjt-P07SDhBcuFWtW1V2HduN_X2EnKcW4whmbVHMYh5xgDRSLOGRFgBC5FpnPJBNZHd3-fOzfGhxtv0sDAD45jO4dId-L99Ueu5-lV3FWZa4carlLBNhVGux6IqumyNG_034oAURigfyKmaX4cYfocdzqbhOSFWjMmxgsfi1IPsoM9r81_ttkY02maTXwfrbZAnKHtnsiBpo67c9sv4NdXCH3A89bAQ-ihoHm-sYr8BQNXmpZm_N63tNMZGlNUwsbRwGR_lCK0u7zkM6DaMFTiSgne-Sp9Hw8eY2ankVIo0FQhMlQqMZOEZ6NlaYrzIsmcZMaylBcAU5l1YYjZ6dW0wQuAGb55IZxqwcC53ZZI-slFUJ-4SqgcpSIw2u-ClXKZMW8ym3I26wLs3jtE8uOpUXugUdd9wXk8IXHwNZxKwIauuTs4XoNCBt_CXUc2r_EmjPHv8w4-IyT91suOiT086sBXqP2xJRJVTzunAFJ-ZcycGfzz0ka747148eHpGVZjaHY7KqP5q3enbiP8BPilTZ4w
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1BT90wDLYmNmnbYbC3TbxtQIR22KXQpmnaHKcJxAQ8OIDErcpLHIb0aNFr337_nKR9GxqX3arWrSq7ju3G_j6AL4WjOEJZW5LxTCQCsUg0z0ViJKKUlTGliGQT5WxW3dyoywFnO8zCIGJoPsMDfxj28m1rVv5X2WFWlrkfp3peCMHTOKy1Xnbl2M-RkQfnIh1ghLJUHWb8IN76KPgENhXfC6k7UoeLPBb_LMkhzhxv_tcbbsGbIZ1k36L938IzbCawOVI1sMFzJ_D6L9zBd3BxFIAj6FHMeuBcz3mFlunFbbu863_ed4xSWdbhwrHeo3A0t6x1bOw9ZA9xuMCLRLzz93B9fHT1_SQZmBUSQyVCn-TSkCEExXo-15Sxciqa5twYpVAKjZVQTlpDvl05ShGERVdVilvOnZpLU7r8A2w0bYPbwHSqy8IqS2t-IXTBlaOMyu-JW6pMq6yYwtdR5bUZYMc9-8WiDuVHquqM11FtU9hfiz5ErI2nhCZe7X8EhrM7j8y4viwKPx0up7A3mrUm__GbIrrBdtXVvuSkrCv_-ORz9-DlydX5WX32Y3b6CV6FXt0wiPgZNvrlCnfghfnV33XL3fAx_gYCqd0q
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Efficient+distributed+algorithms+for+self+testing+of+multiple+processor+systems&rft.jtitle=IEEE+transactions+on+computers&rft.au=Hosseini%2C+S.H.&rft.au=Jamal%2C+N.&rft.date=1992-11-01&rft.pub=IEEE&rft.issn=0018-9340&rft.volume=41&rft.issue=11&rft.spage=1397&rft.epage=1409&rft_id=info:doi/10.1109%2F12.177310&rft.externalDocID=177310
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9340&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9340&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9340&client=summon