Phase retrieval based on a total‐variation‐regularized Poisson model for X‐ray ptychographic imaging of low‐contrast objects

Hard X‐ray ptychography has become an indispensable tool for observing the microscopic structure of a thick specimen. It measures diffraction patterns by scanning an X‐ray beam and visualizes the complex‐valued refractive index of the specimen by a computational reconstruction called phase retrieval...

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Vydané v:	Journal of applied crystallography Ročník 55; číslo 4; s. 978 - 992
Hlavní autori:	Yatabe, Kohei, Takayama, Yuki
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.08.2022 Blackwell Publishing Ltd
Predmet:	Algorithms Computer applications Computing costs Diffraction Diffraction patterns Frequency dependence Frequency ranges hard X‐ray ptychography Image quality Image reconstruction Mathematical models Phase retrieval photon noise removal Refractivity Silica total variation
ISSN:	1600-5767, 0021-8898, 1600-5767
On-line prístup:	Získať plný text
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