Phase retrieval based on a total‐variation‐regularized Poisson model for X‐ray ptychographic imaging of low‐contrast objects

Hard X‐ray ptychography has become an indispensable tool for observing the microscopic structure of a thick specimen. It measures diffraction patterns by scanning an X‐ray beam and visualizes the complex‐valued refractive index of the specimen by a computational reconstruction called phase retrieval...

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Vydáno v:	Journal of applied crystallography Ročník 55; číslo 4; s. 978 - 992
Hlavní autoři:	Yatabe, Kohei, Takayama, Yuki
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.08.2022 Blackwell Publishing Ltd
Témata:	Algorithms Computer applications Computing costs Diffraction Diffraction patterns Frequency dependence Frequency ranges hard X‐ray ptychography Image quality Image reconstruction Mathematical models Phase retrieval photon noise removal Refractivity Silica total variation
ISSN:	1600-5767, 0021-8898, 1600-5767
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Abstract	Hard X‐ray ptychography has become an indispensable tool for observing the microscopic structure of a thick specimen. It measures diffraction patterns by scanning an X‐ray beam and visualizes the complex‐valued refractive index of the specimen by a computational reconstruction called phase retrieval. The quality of imaging is dependent on the used phase‐retrieval algorithm, especially when the intensity of the diffraction patterns in the high‐spatial‐frequency range is low and/or when the spatial overlap of the illumination area is small. In this paper, a phase‐retrieval algorithm, AMPAM, based on the Poisson model and total variation (TV) is proposed. It applies alternating minimization using primal‐dual splitting and gradient‐descent algorithms to compute the result without matrix inversion. The imaging capability of the proposed algorithm from low‐dose and/or sparsely scanned data was investigated by numerical simulations. The proposed algorithm was compared with ADPr, which is the state‐of‐the‐art algorithm based on the TV‐regularized Poisson model. The results indicated that AMPAM can provide good‐quality images with a computational cost 7–11 times less than ADPr. In addition, ink toner and macroporous silica particles were imaged at SPring‐8 BL24XU to confirm the applicability of the algorithm to actual measurements. This paper presents a phase‐retrieval algorithm for ptychography, named AMPAM. The imaging capability of AMPAM was investigated by numerical simulations and measurements performed at SPring‐8.
AbstractList	Hard X‐ray ptychography has become an indispensable tool for observing the microscopic structure of a thick specimen. It measures diffraction patterns by scanning an X‐ray beam and visualizes the complex‐valued refractive index of the specimen by a computational reconstruction called phase retrieval. The quality of imaging is dependent on the used phase‐retrieval algorithm, especially when the intensity of the diffraction patterns in the high‐spatial‐frequency range is low and/or when the spatial overlap of the illumination area is small. In this paper, a phase‐retrieval algorithm, AMPAM, based on the Poisson model and total variation (TV) is proposed. It applies alternating minimization using primal‐dual splitting and gradient‐descent algorithms to compute the result without matrix inversion. The imaging capability of the proposed algorithm from low‐dose and/or sparsely scanned data was investigated by numerical simulations. The proposed algorithm was compared with ADPr, which is the state‐of‐the‐art algorithm based on the TV‐regularized Poisson model. The results indicated that AMPAM can provide good‐quality images with a computational cost 7–11 times less than ADPr. In addition, ink toner and macroporous silica particles were imaged at SPring‐8 BL24XU to confirm the applicability of the algorithm to actual measurements. This paper presents a phase‐retrieval algorithm for ptychography, named AMPAM. The imaging capability of AMPAM was investigated by numerical simulations and measurements performed at SPring‐8. Hard X-ray ptychography has become an indispensable tool for observing the microscopic structure of a thick specimen. It measures diffraction patterns by scanning an X-ray beam and visualizes the complex-valued refractive index of the specimen by a computational reconstruction called phase retrieval. The quality of imaging is dependent on the used phase-retrieval algorithm, especially when the intensity of the diffraction patterns in the high-spatial-frequency range is low and/or when the spatial overlap of the illumination area is small. In this paper, a phase-retrieval algorithm, AMPAM, based on the Poisson model and total variation (TV) is proposed. It applies alternating minimization using primal-dual splitting and gradient-descent algorithms to compute the result without matrix inversion. The imaging capability of the proposed algorithm from low-dose and/or sparsely scanned data was investigated by numerical simulations. The proposed algorithm was compared with ADPr, which is the state-of-the-art algorithm based on the TV-regularized Poisson model. The results indicated that AMPAM can provide good-quality images with a computational cost 7–11 times less than ADPr. In addition, ink toner and macroporous silica particles were imaged at SPring-8 BL24XU to confirm the applicability of the algorithm to actual measurements.
Author	Yatabe, Kohei Takayama, Yuki
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References	Hirose (yr5076_bb16) 2020; 28 Takahashi (yr5076_bb31) 2013; 102 Tripathi (yr5076_bb34) 2014; 22 Deng (yr5076_bb8) 2018; 4 Lo (yr5076_bb24) 2021; 118 Gao (yr5076_bb11) 2020; 56 Bunk (yr5076_bb2) 2008; 108 Villanueva-Perez (yr5076_bb36) 2017; 42 Takayama (yr5076_bb32) 2021; 4 Komodakis (yr5076_bb23) 2015; 32 Takayama (yr5076_bb33) 2020; FY2018 Huang (yr5076_bb21) 2014; 22 Chang (yr5076_bb4) 2019; 27 Henke (yr5076_bb15) 1993; 54 Chapman (yr5076_bb5) 2006; 23 Rudin (yr5076_bb30) 1992; 60 Guizar-Sicairos (yr5076_bb13) 2008; 16 Hirose (yr5076_bb19) 2020; 27 yr5076_bb40 Donnelly (yr5076_bb10) 2016; 94 Donnelly (yr5076_bb9) 2017; 547 Miao (yr5076_bb27) 2006; 97 Valzania (yr5076_bb35) 2018; 43 yr5076_bb37 Harada (yr5076_bb14) 2013; 52 Rosenthal (yr5076_bb29) 2003; 333 Chambolle (yr5076_bb3) 2011; 40 Hirose (yr5076_bb17) 2019; 2 Patil (yr5076_bb28) 2019; 1 Maiden (yr5076_bb25) 2009; 109 Cuesta (yr5076_bb7) 2019; 6 yr5076_bb6 Hirose (yr5076_bb18) 2017; 25 Matsushima (yr5076_bb26) 2009; 17 yr5076_bb12 Howells (yr5076_bb20) 2009; 170 Kazantsev (yr5076_bb22) 2019; 9 yr5076_bb1
References_xml	– volume: 118 start-page: e2019068118 year: 2021 ident: yr5076_bb24 publication-title: Proc. Natl Acad. Sci. USA doi: 10.1073/pnas.2019068118 – volume: 40 start-page: 120 year: 2011 ident: yr5076_bb3 publication-title: J. Math. Imaging Vis. doi: 10.1007/s10851-010-0251-1 – ident: yr5076_bb6 – volume: 16 start-page: 7264 year: 2008 ident: yr5076_bb13 publication-title: Opt. Express doi: 10.1364/OE.16.007264 – volume: 2 start-page: 50 year: 2019 ident: yr5076_bb17 publication-title: Commun. Chem. doi: 10.1038/s42004-019-0147-y – volume: 32 start-page: 31 year: 2015 ident: yr5076_bb23 publication-title: IEEE Signal Process. Mag. doi: 10.1109/MSP.2014.2377273 – volume: 9 start-page: 317 year: 2019 ident: yr5076_bb22 publication-title: SoftwareX doi: 10.1016/j.softx.2019.04.003 – volume: 97 start-page: 215503 year: 2006 ident: yr5076_bb27 publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.97.215503 – ident: yr5076_bb40 – volume: 4 start-page: eaau4548 year: 2018 ident: yr5076_bb8 publication-title: Sci. Adv. doi: 10.1126/sciadv.aau4548 – volume: 108 start-page: 481 year: 2008 ident: yr5076_bb2 publication-title: Ultramicroscopy doi: 10.1016/j.ultramic.2007.08.003 – ident: yr5076_bb12 – volume: 109 start-page: 1256 year: 2009 ident: yr5076_bb25 publication-title: Ultramicroscopy doi: 10.1016/j.ultramic.2009.05.012 – ident: yr5076_bb37 – volume: 17 start-page: 19662 year: 2009 ident: yr5076_bb26 publication-title: Opt. Express doi: 10.1364/OE.17.019662 – volume: 4 start-page: 48 year: 2021 ident: yr5076_bb32 publication-title: Commun. Phys. doi: 10.1038/s42005-021-00539-x – volume: 22 start-page: 1452 year: 2014 ident: yr5076_bb34 publication-title: Opt. Express doi: 10.1364/OE.22.001452 – volume: 1 start-page: 1787 year: 2019 ident: yr5076_bb28 publication-title: ACS Appl. Polym. Mater. doi: 10.1021/acsapm.9b00324 – volume: 547 start-page: 328 year: 2017 ident: yr5076_bb9 publication-title: Nature doi: 10.1038/nature23006 – volume: 170 start-page: 4 year: 2009 ident: yr5076_bb20 publication-title: J. Electron Spectrosc. Relat. Phenom. doi: 10.1016/j.elspec.2008.10.008 – volume: 56 start-page: 13373 year: 2020 ident: yr5076_bb11 publication-title: Chem. Commun. doi: 10.1039/D0CC06101H – volume: 28 start-page: 1216 year: 2020 ident: yr5076_bb16 publication-title: Opt. Express doi: 10.1364/OE.378083 – volume: 102 start-page: 094102 year: 2013 ident: yr5076_bb31 publication-title: Appl. Phys. Lett. doi: 10.1063/1.4794063 – volume: 27 start-page: 455 year: 2020 ident: yr5076_bb19 publication-title: J. Synchrotron Rad. doi: 10.1107/S1600577519017004 – volume: 6 start-page: 473 year: 2019 ident: yr5076_bb7 publication-title: IUCrJ doi: 10.1107/S2052252519003774 – volume: 22 start-page: 12634 year: 2014 ident: yr5076_bb21 publication-title: Opt. Express doi: 10.1364/OE.22.012634 – volume: FY2018 start-page: 132 year: 2020 ident: yr5076_bb33 publication-title: SPring-8/SACLA Annu. Rep. – volume: 23 start-page: 1179 year: 2006 ident: yr5076_bb5 publication-title: J. Opt. Soc. Am. A doi: 10.1364/JOSAA.23.001179 – volume: 54 start-page: 181 year: 1993 ident: yr5076_bb15 publication-title: At. Data Nucl. Data Tables doi: 10.1006/adnd.1993.1013 – volume: 94 start-page: 064421 year: 2016 ident: yr5076_bb10 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.94.064421 – volume: 25 start-page: 8593 year: 2017 ident: yr5076_bb18 publication-title: Opt. Express doi: 10.1364/OE.25.008593 – ident: yr5076_bb1 doi: 10.1007/978-3-319-48311-5 – volume: 60 start-page: 259 year: 1992 ident: yr5076_bb30 publication-title: Physica D doi: 10.1016/0167-2789(92)90242-F – volume: 52 start-page: 06GB02 year: 2013 ident: yr5076_bb14 publication-title: Jpn. J. Appl. Phys. doi: 10.7567/JJAP.52.06GB02 – volume: 42 start-page: 1133 year: 2017 ident: yr5076_bb36 publication-title: Opt. Lett. doi: 10.1364/OL.42.001133 – volume: 27 start-page: 10395 year: 2019 ident: yr5076_bb4 publication-title: Opt. Express doi: 10.1364/OE.27.010395 – volume: 333 start-page: 721 year: 2003 ident: yr5076_bb29 publication-title: J. Mol. Biol. doi: 10.1016/j.jmb.2003.07.013 – volume: 43 start-page: 543 year: 2018 ident: yr5076_bb35 publication-title: Opt. Lett. doi: 10.1364/OL.43.000543
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Snippet	Hard X‐ray ptychography has become an indispensable tool for observing the microscopic structure of a thick specimen. It measures diffraction patterns by... Hard X-ray ptychography has become an indispensable tool for observing the microscopic structure of a thick specimen. It measures diffraction patterns by...
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SubjectTerms	Algorithms Computer applications Computing costs Diffraction Diffraction patterns Frequency dependence Frequency ranges hard X‐ray ptychography Image quality Image reconstruction Mathematical models Phase retrieval photon noise removal Refractivity Silica total variation
Title	Phase retrieval based on a total‐variation‐regularized Poisson model for X‐ray ptychographic imaging of low‐contrast objects
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