Dynamic dispatching system using a deep denoising autoencoder for semiconductor manufacturing

Deep denoising autoencoders (DDAE), which are variants of the autoencoder, have shown outstanding performance in various machine learning tasks. In this study, we propose using a DDAE to address a dispatching rule selection problem that represents a major problem in semiconductor manufacturing. Rece...

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Bibliographic Details

Published in:	Applied soft computing Vol. 86; p. 105904
Main Authors:	Lee, Sangmin, Kim, Hae Joong, Kim, Seoung Bum
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01.01.2020
Subjects:	Class imbalance problem Deep denoising autoencoder Dispatching rule selection Novelty detection Storage allocation Dispatching rule selection Storage allocation Deep denoising autoencoder Novelty detection Class imbalance problem
ISSN:	1568-4946, 1872-9681
Online Access:	Get full text
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