On the implementation of an analog ATPG: the nonlinear case

In order to reduce the complexity of the fault diagnosis equations and still retain computational simplicity, a self-testing algorithm has been proposed and implemented on a VMS VAX 11/780 for linear circuits. A prototype implementation of such an algorithm for nonlinear circuits and systems is pres...

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Vydáno v:IEEE transactions on instrumentation and measurement Ročník 37; číslo 2; s. 252 - 258
Hlavní autoři: Wey, C.-L., Saeks, R.
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York, NY IEEE 01.06.1988
Institute of Electrical and Electronics Engineers
Témata:
Applied sciences
Automatic test pattern generation
Automatic testing
Built-in self-test
Circuit simulation
Circuit testing
Electronics
Exact sciences and technology
Fault diagnosis
Nonlinear circuits
Nonlinear equations
SPICE
Testing, measurement, noise and reliability
Voice mail
Non linear circuit
Implantation
Circuit parameter
Simulation
Algorithm
Fault diagnostic
ISSN:0018-9456, 1557-9662
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Shrnutí:In order to reduce the complexity of the fault diagnosis equations and still retain computational simplicity, a self-testing algorithm has been proposed and implemented on a VMS VAX 11/780 for linear circuits. A prototype implementation of such an algorithm for nonlinear circuits and systems is presented. The proposed analog automatic test program generator (AATPG) for nonlinear circuits and systems is divided into offline and online processes. Unlike the simulation of the pseudocircuits in the linear case, which can be achieved by a matrix/vector multiplication, the circuit simulator SPICE is used to simulate the nonlinear pseudocircuits. The automatic SPICE code generator required for this simulation is presented. The proposed AATPG for nonlinear circuits has been implemented on a VMS VAX 11/780. The actual test can be run in either a fully automatic mode or interactively.< >
Bibliografie:ObjectType-Article-2
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ISSN:0018-9456
1557-9662
DOI:10.1109/19.6061