Concatenated BCH and LDPC Coding Scheme With Iterative Decoding Algorithm for Flash Memory

As adopting a very powerful error-correcting code gradually becomes a strategic demand for the endurance of nowadays flash memory, LDPC codes are recently proposed due to their outstanding error correcting capability. However, the error floor phenomenon of LDPC codes might not meet the extreme low e...

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Published in:IEEE communications letters Vol. 19; no. 3; pp. 327 - 330
Main Author: Shieh, Shin-Lin
Format: Journal Article
Language:English
Published: New York IEEE 01.03.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
Ash
Bit error rate
Decoding
Encoding
Iterative decoding
Reliability
flash memory
error floor
concatenated code
BCH code
Low-density parity-check code
ISSN:1089-7798, 1558-2558
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Abstract As adopting a very powerful error-correcting code gradually becomes a strategic demand for the endurance of nowadays flash memory, LDPC codes are recently proposed due to their outstanding error correcting capability. However, the error floor phenomenon of LDPC codes might not meet the extreme low error rate requirement of flash memory applications. Thus, concatenation of BCH and LDPC codes that strikes a balance between superb error correcting capability and low error floor becomes an alternative system structure. In this work, a modification of such concatenated coding system in Chen et al. [IEEE Commun. Lett., vol. 17, no. 5, pp. 980-983, May 2013] is proposed. Compared with the previous concatenated coding system via simulations, our design improves the error correcting capability in the waterfall region while keeps low error floor.
AbstractList As adopting a very powerful error-correcting code gradually becomes a strategic demand for the endurance of nowadays flash memory, LDPC codes are recently proposed due to their outstanding error correcting capability. However, the error floor phenomenon of LDPC codes might not meet the extreme low error rate requirement of flash memory applications. Thus, concatenation of BCH and LDPC codes that strikes a balance between superb error correcting capability and low error floor becomes an alternative system structure. In this work, a modification of such concatenated coding system in Chen et al. [IEEE Commun. Lett., vol. 17, no. 5, pp. 980-983, May 2013] is proposed. Compared with the previous concatenated coding system via simulations, our design improves the error correcting capability in the waterfall region while keeps low error floor.
Author Shin-Lin Shieh
Author_xml – sequence: 1
  givenname: Shin-Lin
  surname: Shieh
  fullname: Shieh, Shin-Lin
BookMark eNp9kF1LwzAUhoNMcE7_gN4EvO5M0qYfl7NzbtAxQUXwpqTpydbRJjPthP17Mzu88MKLfMA5zzm8zyUaaKMBoRtKxpSS5D5LV8vlmBHKx8xPKAvJGRpSzmOPuWvg_iROvChK4gt02bZbQkjMOB2ij9RoKTrQ7pT4IZ1joUucTZ9TnJqy0mv8IjfQAH6vug1edGBFV30BnoLsy5N6bayrNVgZi2e1aDd4CY2xhyt0rkTdwvXpHaG32eNrOvey1dMinWSeZAnvvDIgfqiYirkkSalCyuKChYKFhYwUFTQqCk4SVqooYMAKl04EhIQKBJNKQuGP0F0_d2fN5x7aLt-avdVuZU7D0PdJwDlxXXHfJa1pWwsql1XnshjdWVHVOSX50WT-YzI_msxPJh3K_qA7WzXCHv6HbnuoAoBfIHLeg9j3vwHPBIAp
CODEN ICLEF6
CitedBy_id crossref_primary_10_1109_TCSII_2019_2960484
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Cites_doi 10.1109/TIT.2004.831841
10.1109/ITA.2014.6804221
10.1109/LCOMM.2013.031913.130142
10.1109/LCOMM.2003.814716
10.1109/26.494301
10.1109/GLOCOMW.2010.5700263
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2015
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2015
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
DOI 10.1109/LCOMM.2015.2391260
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE/IET Electronic Library
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1558-2558
EndPage 330
ExternalDocumentID 3623504061
10_1109_LCOMM_2015_2391260
7008483
Genre orig-research
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
AZLTO
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
H~9
IES
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
TN5
VH1
AAYXX
CITATION
7SP
8FD
L7M
RIG
ID FETCH-LOGICAL-c295t-d4036f2f85c09df6128b26a26bc7f1a17bb5092df742e2b391a4006fea2cfceb3
IEDL.DBID RIE
ISICitedReferencesCount 8
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000351407800005&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1089-7798
IngestDate Mon Jun 30 10:25:33 EDT 2025
Sat Nov 29 06:26:33 EST 2025
Tue Nov 18 21:02:36 EST 2025
Wed Aug 27 02:48:16 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 3
Keywords flash memory
error floor
concatenated code
BCH code
Low-density parity-check code
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c295t-d4036f2f85c09df6128b26a26bc7f1a17bb5092df742e2b391a4006fea2cfceb3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
PQID 1663304550
PQPubID 85419
PageCount 4
ParticipantIDs crossref_primary_10_1109_LCOMM_2015_2391260
crossref_citationtrail_10_1109_LCOMM_2015_2391260
proquest_journals_1663304550
ieee_primary_7008483
PublicationCentury 2000
PublicationDate 2015-March
2015-3-00
20150301
PublicationDateYYYYMMDD 2015-03-01
PublicationDate_xml – month: 03
  year: 2015
  text: 2015-March
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE communications letters
PublicationTitleAbbrev COML
PublicationYear 2015
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref8
ref7
richardson (ref5) 0
ref9
lin (ref4) 2004
ref3
ref6
ref1
cai (ref2) 0
References_xml – ident: ref3
  doi: 10.1109/TIT.2004.831841
– start-page: 521
  year: 0
  ident: ref2
  article-title: Error patterns in MLC NAND flash memory: Measurement, characterization, analysis
  publication-title: Proc Des Autom Test Eur Conf Exhib
– start-page: 1426
  year: 0
  ident: ref5
  article-title: Error floors of LDPC codes
  publication-title: Proc Allerton Conf Commun Control Comput
– ident: ref9
  doi: 10.1109/ITA.2014.6804221
– ident: ref6
  doi: 10.1109/LCOMM.2013.031913.130142
– year: 2004
  ident: ref4
  publication-title: Error Control Coding
– ident: ref8
  doi: 10.1109/LCOMM.2003.814716
– ident: ref7
  doi: 10.1109/26.494301
– ident: ref1
  doi: 10.1109/GLOCOMW.2010.5700263
SSID ssj0008251
Score 2.1667042
Snippet As adopting a very powerful error-correcting code gradually becomes a strategic demand for the endurance of nowadays flash memory, LDPC codes are recently...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 327
SubjectTerms Ash
Bit error rate
Decoding
Encoding
Iterative decoding
Reliability
Title Concatenated BCH and LDPC Coding Scheme With Iterative Decoding Algorithm for Flash Memory
URI https://ieeexplore.ieee.org/document/7008483
https://www.proquest.com/docview/1663304550
Volume 19
WOSCitedRecordID wos000351407800005&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-2558
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0008251
  issn: 1089-7798
  databaseCode: RIE
  dateStart: 19970101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB5UPOjBt1hf7MGbRrPb5rFHjRaFVgUVxUvYpxVsIm0V_PfObtIqKIKHQGB3Q5gvO_NNdh4Ae1KGqbShCpo6dSk5LdSDrbAZCB4pGjONFt0nCneSy8v04YFfT8HBJBfGGOODz8yhu_Vn-bpUb-5X2VHiq783p2E6SeIqV2uidV0KZhVMz5Ex8nScIBPyo0521e26KK7okDU5Zb4c5ZcR8l1Vfqhib1_ai_97syVYqHkkOa6AX4YpU6zA_LfqgqvwmJWu4qsp8NLkJDsnotCkc3qdkax0JovcIGJ9Q-6fRz1y4csro-4jp-iR-uHjl6dygGN9gsyWtJFn90jXReZ-rMFd--w2Ow_qVgqBYjwaBRrlH1tm00iFXFukNalksWCxVImlgiZSInNg2qKnbJhEKQnc3LE1gimr0OFeh5miLMwGEKokE4wJzqhuxZqKxIoolIrZxIgo1g2gY9nmqq4z7tpdvOTe3wh57vHIHR55jUcD9idrXqsqG3_OXnUITGbWwm_A9hjCvN6Iw5wio3KHwVG4-fuqLZhzz67CyrZhZjR4Mzswq95Hz8PBrv_GPgEHl8z_
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT9tAEB6lUKnlUFpC1dDQ7oEbdfBu4sceqWmUqE6IRBARF2ufBQlsFEKl_ntmN06o1AqJgyVLuytb83nn4Z35BuBAyjCVNlRBV6euJKeHerAXdgPBI0VjptGi-0LhPBmP09mMTxrwbV0LY4zxyWem4279Wb6u1IP7VXaUePb37ivYdJ2z6mqttd51RZjLdHqOPiNPVyUyIT_Ks9PRyOVxRR3W5ZR5QsonM-T7qvyjjL2F6W-_7N3ew7vakyTHS-g_QMOUO7D1F79gEy6zynG-mhIvTb5nAyJKTfKTSUayyhktcoaY3Rpycb24IkNPsIzaj5xgTOqHj29-VXMcuyXo25I-etpXZORyc__swnn_xzQbBHUzhUAxHi0CjQjEltk0UiHXFh2bVLJYsFiqxFJBEynRd2DaYqxsmEQpCdzesTWCKasw5P4IG2VVmk9AqJJMMCY4o7oXayoSK6JQKmYTI6JYt4CuZFuommncNby4KXzEEfLC41E4PIoajxYcrtfcLXk2np3ddAisZ9bCb0F7BWFRb8X7gqJP5Y6Do3Dv_6u-wpvBdJQX-XD88zO8dc9ZJpm1YWMxfzD78Fr9Xlzfz7_47-0R4N7QSA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Concatenated+BCH+and+LDPC+Coding+Scheme+With+Iterative+Decoding+Algorithm+for+Flash+Memory&rft.jtitle=IEEE+communications+letters&rft.au=Shieh%2C+Shin-Lin&rft.date=2015-03-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=1089-7798&rft.eissn=1558-2558&rft.volume=19&rft.issue=3&rft.spage=327&rft_id=info:doi/10.1109%2FLCOMM.2015.2391260&rft.externalDBID=NO_FULL_TEXT&rft.externalDocID=3623504061
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1089-7798&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1089-7798&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1089-7798&client=summon