Local Gradient Hexa Pattern: A Descriptor for Face Recognition and Retrieval

Local descriptors used in face recognition are robust in a sense that these descriptors perform well in varying pose, illumination, and lighting conditions. The accuracy of these descriptors depends on the precision of mapping the relationship that exists in the local neighborhood of a facial image...

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Veröffentlicht in:IEEE transactions on circuits and systems for video technology Jg. 28; H. 1; S. 171 - 180
Hauptverfasser: Chakraborty, Soumendu, Singh, Satish Kumar, Chakraborty, Pavan
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York IEEE 01.01.2018
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:1051-8215, 1558-2205
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Zusammenfassung:Local descriptors used in face recognition are robust in a sense that these descriptors perform well in varying pose, illumination, and lighting conditions. The accuracy of these descriptors depends on the precision of mapping the relationship that exists in the local neighborhood of a facial image into microstructures. In this paper, a local gradient hexa pattern is proposed that identifies the relationship among the reference pixel and its neighboring pixels at different distances across different derivative directions. Discriminative information exists in the local neighborhood as well as in different derivative directions. The proposed descriptor effectively transforms these relationships into binary micropatterns discriminating inter-class facial images with optimal precision. The recognition and retrieval performance of the proposed descriptor has been compared with state-of-the-art descriptors, namely, local derivative pattern, local tetra pattern, multiblock local binary pattern, and local vector pattern over the most challenging and benchmark facial image databases, i.e., Cropped Extended Yale B, CMU-PIE, color-FERET, LFW, and Ghallager database. The proposed descriptor has better recognition as well as retrieval rates compared with state-of-the-art descriptors.
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ISSN:1051-8215
1558-2205
DOI:10.1109/TCSVT.2016.2603535