Accuracy of IGBT Junction Temperature Prediction: An Improved Sailfish Algorithm to Optimize Support Vector Machine

This study improves the accuracy of junction temperature prediction, as the insulated gate bipolar transistor (IGBT) reliability is important for the safe operation of its working system due to junction temperature is limited in its actual performance and reliability. A model based on an improved sa...

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Veröffentlicht in:	IEEE transactions on power electronics Jg. 39; H. 6; S. 6864 - 6876
Hauptverfasser:	Li, Lingling, Liu, Jiaqi, Tseng, Ming-Lang, Lim, Ming K.
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	New York IEEE 01.06.2024 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Schlagworte:	Accuracy Algorithms Errors Improved sailfish optimization algorithm insulated gate bipolar transistor Insulated gate bipolar transistors junction temperature prediction Junctions Optimization Optimization algorithms Performance indices Prediction algorithms Predictive models Reliability Reliability analysis Semiconductor devices support vector machine (SVM) Support vector machines System reliability Temperature measurement Temperature sensors
ISSN:	0885-8993, 1941-0107
Online-Zugang:	Volltext
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