System-Level Signal Analysis Methodology for Optical Network-on-Chip Using Linear Model-Based Characterization
State-of-the-art silicon photonics technology has demonstrated its potential use in all required building blocks for ultrahigh bandwidth on-chip optical links. However, a robust system-level abstraction model reflecting the properties of optical devices has not been well established. We propose a li...
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| Vydané v: | IEEE transactions on computer-aided design of integrated circuits and systems Ročník 39; číslo 10; s. 2761 - 2771 |
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| Hlavní autori: | , , |
| Médium: | Journal Article |
| Jazyk: | English |
| Vydavateľské údaje: |
New York
IEEE
01.10.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Predmet: | |
| ISSN: | 0278-0070, 1937-4151 |
| On-line prístup: | Získať plný text |
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| Shrnutí: | State-of-the-art silicon photonics technology has demonstrated its potential use in all required building blocks for ultrahigh bandwidth on-chip optical links. However, a robust system-level abstraction model reflecting the properties of optical devices has not been well established. We propose a linear optical device model (LODM) for silicon photonic devices and an associated computation method of optical signal propagation (CMOP) in an optical network-on-chip (ONoC). The CMOP manipulates the optical signal routing paths according to the topology, router configuration, and routing algorithm of the given ONoC architecture; thus, it allows the transformed information to be adaptable in an LODM to facilitate simplified analysis. Furthermore, we construct a linear system model of a microring resonator (MR) to reduce the computation complexities caused by its resonance structure. By using the CMOP, we accelerate the system-level analysis of optical signal propagation in ONoCs, reflecting the propagation loss, interference, and phase shift with close accuracy to analog and mixed-signal extensions (AMS) environments. The evaluation results show that the computation speeds up by three orders of magnitude with 1.57% error in accuracy when compared to the AMS environments. |
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| Bibliografia: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
| ISSN: | 0278-0070 1937-4151 |
| DOI: | 10.1109/TCAD.2019.2945709 |